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  1. Ehrmann, Albrecht; Rau, Jenspeter; Wolter, Andreas; Kamm, Frank-Michael; Mathuni, Josef; Scholze, Frank; Tummler, Johannes; Ulm, Gerhard

    Mask CD characterization with EUV reflectometry at the electron storage ring BESSY II

    Conference Proceedings
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    SPIE, 2003

    Published in: 19th European Conference on Mask Technology for Integrated Circuits and Microcomponents

  2. Tóth, Balázs; Wilke, Martina; Stanke, Frauke; Dorsch, Martina; Jansen, Silke; Wedekind, Dirk; Charizopoulou, Nikoletta; Bot, Alice; Burmester, Marion; Leonhard-Marek, Sabine; de Jonge, Hugo R; Hedrich, Hans-Jürgen; Breves, Gerhard; Tümmler, Burkhard

    Very mild disease phenotype of congenic Cftr TgH(neoim)Hgu cystic fibrosis mice

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    Springer Science and Business Media LLC, 2008

    Published in: BMC Genetics