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  1. Remond, G. [Editor] ; Scanning Microscopy International Chicago, Ill, Pfefferkorn Conference 11 1992 Amherst, Mass

    Physics of generation and detection of signals used for microcharacterization : proceedings of the 11th Pfefferkorn Conference, held August 9 to 14, 1992 at Univ. Massachusetts, Amherst

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    AMF O'Hare, Ill.: Scanning Microscopy International, 1993

    Published in: Scanning microscopy ; 7

  2. Huang, Thomas S. [Editor]; Bruton, Leonard T. [Other]

    Two-dimensional digital signal processing

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    Berlin; Heidelberg; New York: Springer, 1981-

    Published in: Topics in applied physics ; .

  3. Wilkinson, Michael H. F. [Other]; Roerdink, Jos B. T. M. [Other]; Wilkinson, Michael Hendrik Francis [Editor] ; ISMM 9 2009 Groningen

    Mathematical morphology and its application to signal and image processing : 9th international symposium, ISMM 2009 Groningen, The Netherlands, August 24-27, 2009 ; proceedings

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    Berlin; Heidelberg [u.a.]: Springer, 2009

    Published in: Lecture notes in computer science ; 5720

  4. Bachmann, Rolf [Other] ; VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik Fachausschuss Signalverarbeitung in der Mess- und Automatisierungstechnik, Aussprachetag Messsignalverarbeitung und Diagnose - Mittel zur Prozess- und Qualitätssicherung 1995 Langen (Hessen)

    Meßsignalverarbeitung und Diagnose - Mittel zur Prozeß- und Qualitätssicherung : Manuskripte der Beiträge zum VDI/VDE-GMA-Aussprachetag "Meßsignalverarbeitung und Diagnose - Mittel zur Prozeß- und Qualitätssicherung"; 21. und 22. März 1995 in Langen

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    Düsseldorf: GMA, [ca. 1995]

    Published in: VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik: GMA-Bericht ; 24

  5. Roomans, Godfried M. [Editor]; Roomans, G.M [Other] ; Scanning Microscopy International Chicago, Ill, Pfefferkorn Conference 12 1993 Cambridge

    The science of biological microanalysis : proceedings of the 12. Pfefferkorn conference held September 27 to 30, 1993, at the University of Cambridge, U.K.

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    AMF O'Hare, Ill.: Scanning Microscopy International, 1994

    Published in: Scanning microscopy ; 8