Skip to contents Brandon, David G. [Author]; Kaplan, Wayne D. [Author] Microstructural characterization of materials - [2nd edition] Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Chichester: John Wiley & Sons, Ltd, [2008] Published in: Quantitative software engineering series
Brandon, David G. [Author]; Kaplan, Wayne D. [Author] Microstructural characterization of materials - [2nd edition] Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Chichester: John Wiley & Sons, Ltd, [2008] Published in: Quantitative software engineering series
> Subject Skip to next facet Chemistry and pharmacology (1) Wert ausschließen Physics (1) Wert ausschließen Technology (1) Wert ausschließen Show more show less
> Creator Skip to next facet Brandon, David G. (1) Wert ausschließen Kaplan, Wayne D. (1) Wert ausschließen Show more show less