Skip to contents Bhattacharyya, A. B. [Author] ; Bhattacharyya, Amalendu Bhushan [Other] Compact MOSFET models for VLSI design Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Singapore [u.a.]: Wiley, c2009 Bhattacharyya, A. B. [Other] ; IEEE Xplore (Online Service), Wiley InterScience (Online service) Compact MOSFET models for VLSI design Books View online Schließen > Access http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5681002 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Singapore; Hoboken, NJ; Piscataway, NJ: John Wiley & Sons (Asia), [2009] ; Online-Ausg. Published in: IEEE Xplore Digital Library Kalra, Shruti; Bhattacharyya, Amalendu Bhushan A Unified Analytical Transregional MOSFET Model for Nanoscale CMOS Digital Technologies Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2020 Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields Sharma, Rohit; Chakravarty, Tapas; Bhattacharyya, Amalendu Bhushan Analytical Model for Optimum Signal Integrity in PCB Interconnects Using Ground Tracks Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Transactions on Electromagnetic Compatibility
Bhattacharyya, A. B. [Author] ; Bhattacharyya, Amalendu Bhushan [Other] Compact MOSFET models for VLSI design Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Singapore [u.a.]: Wiley, c2009
Bhattacharyya, A. B. [Other] ; IEEE Xplore (Online Service), Wiley InterScience (Online service) Compact MOSFET models for VLSI design Books View online Schließen > Access http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5681002 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Singapore; Hoboken, NJ; Piscataway, NJ: John Wiley & Sons (Asia), [2009] ; Online-Ausg. Published in: IEEE Xplore Digital Library
Kalra, Shruti; Bhattacharyya, Amalendu Bhushan A Unified Analytical Transregional MOSFET Model for Nanoscale CMOS Digital Technologies Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2020 Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
Sharma, Rohit; Chakravarty, Tapas; Bhattacharyya, Amalendu Bhushan Analytical Model for Optimum Signal Integrity in PCB Interconnects Using Ground Tracks Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Transactions on Electromagnetic Compatibility
> Media type Skip to next facet Articles (2) Wert ausschließen Books (2) Wert ausschließen Show more show less
> Location Skip to next facet Departmental Library DrePunct (1) Wert ausschließen Show more show less
> Language Skip to next facet English (3) Wert ausschließen Not determined (1) Wert ausschließen Show more show less
> Subject Skip to next facet Technology (4) Wert ausschließen Mathmatics (2) Wert ausschließen Physics (2) Wert ausschließen Computer science (1) Wert ausschließen Show more show less
> Creator Skip to next facet Bhattacharyya, Amalendu Bhushan (3) Wert ausschließen Bhattacharyya, A. B. (2) Wert ausschließen Chakravarty, Tapas (1) Wert ausschließen IEEE Xplore (Online Service) (1) Wert ausschließen Kalra, Shruti (1) Wert ausschließen Sharma, Rohit (1) Wert ausschließen Wiley InterScience (Online service) (1) Wert ausschließen Show more show less
> Collection Skip to next facet Verbunddaten SWB (2) Wert ausschließen Institute of Electrical and Electronics Engineers (IEEE) (CrossRef) (1) Wert ausschließen Wiley (CrossRef) (1) Wert ausschließen Show more show less