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  1. IEEE Electron Devices Society, International Reliability Physics Symposium

    Reliability physics : annual proceedings

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    New York, NY: IEEE, 1974-1989 / 12.1974 - 27.1989

  2. Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society, International Reliability Physics Symposium 33 1995 Las Vegas, Nev

    1995 IEEE international reliability physics proceedings : 33rd annual

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    Piscataway, NJ: IEEE Service Center, 1995

  3. International Symposium on Software Reliability Engineering 6 1995 Toulouse, IEEE Computer Society Software Engineering Technical Committee, Laboratoire d'Automatique et d'Analyse des Systèmes Toulouse

    Proceedings / the Sixth International Symposium on Software Reliability Engineering, October 24 - 27, 1995, Toulouse, France

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society Press, 1995

  4. Gotlieb, Arnaud [Other] ; IEEE Reliability Society

    2013 13th International Conference on Quality Software (QSIC) : 29 - 30 Aug. 2013, Nanjing, Jiangsu, China ; [held parallel to the conference:] Symposium on Engineering Test Harness (TSETH), Workshop on Testing and Verification of Embedded Computing Systems (TVECS), Workshop on Quality and Measurement of Software Model-Driven Developments (QUAMES), Workshop on Software Quality Assurance of Healthcare Systems and Embedded Systems (SQHE)

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    Piscataway, NJ: IEEE, 2013

  5. Yang, Jun [Editor]; Fang, Dongming [Editor]; Wang, Ziyao [Editor]; Zhao, Tingdi [Editor] ; ICRSE 2. 2017 Huairou, IEEE Reliability Society

    2017 The second International Conference on Reliability Systems Engineering (ICRSE 2017) : 10-12 July 2017, Beijing Yanqi Lake International Convention & Exhibition Center (BYCC), Huairou, Beijing, China

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    [Piscataway, NJ]: IEEE, 2017

  6. Gao, Ming [Organizer] ; International Conference on Dependable Systems and their Applications 4. 2017 Peking, IEEE Reliability Society

    Fourth International Conference on Dependable Systems and their Applications : DSA 2017 : 31 October-2 November 2017, Beijing, China : proceedings

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    Piscataway, NJ: IEEE, 2017