Skip to contents Pecht, Michael [Other] Contamination of electronic assemblies Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla.: CRC Press, 2003 Published in: Electronic packaging series Pecht, Michael [Other] Electronic packaging materials and their properties Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, c1999 Published in: The Electronic packaging series Pecht, Michael [Editor] Handbook of electronic package design Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. New York [u.a.]: Dekker, 1991 Published in: Mechanical engineering ; 7600 Lall, Pradeep [Author] ; Pecht, Michael [Other]; Hakim, Edward B. [Other] Influence of temperature on microelectronics and system reliability Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, 1997 Published in: The electronic packaging series Ganesan, Sanka [Editor]; Pecht, Michael [Other] Lead-free electronics Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken, NJ: Wiley-Interscience [u.a.], 2006 Pecht, Judy [Author]; Pecht, Michael [Author] Long-term non-operating reliability of electronic products Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, c1995 Pecht, Michael G. [Other]; Wong, Yeun Tsun [Other]; Pecht, Michael [Editor] Advanced routing of electronic modules Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton [u.a.]: CRC Press, c1996 Published in: Electronic packages, interconnects, and product series Ardebili, Haleh [Author]; Pecht, Michael [Author] Encapsulation technologies for electronic applications Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Oxford: Elsevier, 2009 Published in: Materials and processes for electronic application Pecht, Michael [Author]; Radojcic, Riko [Author]; Rao, Gopal K. [Author] Guidebook for managing silicon chip reliability Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, 1999 Published in: The electronic packaging series Kapur, Kailash C. [Author] ; Pecht, Michael [Contributor] Reliability engineering Books View online Schließen > Access https://learning.oreilly.com/library/view/-/9781118841792/?ar Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken, N.J.: J. Wiley & Sons, c2014 Published in: Wiley series in systems engineering and management Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on Reliability Engineering 4. 2019 Rom 4th International Conference on Reliability Engineering (ICRE 2019) : 20-22 November 2019, Rome, Italy Books View online Schließen > Access http://iopscience.iop.org/1757-899X/836/1 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Bristol]: IOP Publishing, 06 May 2020 Published in: Institute of Physics: IOP conference series / Materials science and engineering ; 836 Pecht, Michael [Editor]; Kyeong, San [Editor] Electrical connectors : design, manufacture, test, and selection Books View online Schließen > Access https://ieeexplore.ieee.org/servlet/opac?bknumber=9295062 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken: Wiley IEEE Press, 2021 Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on Reliability Engineering 3. 2018 Barcelona 2018 3rd International Conference on Reliability Engineering : 24-26 November 2018, Barcelona, Spain Books View online Schließen > Access http://iopscience.iop.org/1757-899X/575/1 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Bristol]: IOP Publishing, [2019] Published in: Institute of Physics: IOP conference series / Materials science and engineering ; 575 Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on System Reliability and Safety 4. 2019 Rom 2019 4th International Conference on System Reliability and Safety : ICSRS 2019 : Rome, Italy, 20-22 November 2019 Books View online Schließen > Access Full access (via DOI) Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Piscataway, NJ: IEEE, 2019 Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on System Reliability and Safety 3. 2018 Barcelona 2018 3rd International Conference on System Reliability and Safety : ICSRS 2018 : Barcelona, Spain, 24-26 November 2018 : proceedings Books View online Schließen > Access https://ieeexplore.ieee.org/servlet/opac?punumber=8672656 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Piscataway, NJ: IEEE, 2018 Pecht, Michael [Editor]; Kang, Myeongsu [Editor] Prognostics and health management of electronics : fundamentals, machine learning, and the internet of things Books View online Schließen > Access https://ieeexplore.ieee.org/book/8470990?bknumber=8470990 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken, NJ: Wiley-IEEE Press, 2018 Zhao, Tingdi [Editor]; Pecht, Michael [Editor]; Zhang, Shunong [Editor] ; Prognostics and System Health Management Conference 6. 2015 Peking 2015 PHM-Beijing : proceedings of 2015 Prognostics and System Health Management Conference : 21-23 October 2015, Vision Hotel, Beijing, China Books View online Schließen > Access http://ieeexplore.ieee.org/servlet/opac?punumber=7368255 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Piscataway, NJ]: IEEE, 2015 Chung, Henry Shu-hung [Editor]; Wang, Huai [Editor]; Blaabjerg, Frede [Editor]; Pecht, Michael [Editor] Reliability of power electronic converter systems Books View online Schließen > Access https://ebookcentral.proquest.com/lib/slub/detail.action?docID=4332367 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. London: The Institution of Engineering and Technology, 2016 Published in: IET power and energy series ; 80 Lee, Namkyoung [Author]; Azarian, Michael H. [Author]; Pecht, Michael [Author] Octave-band filtering for convolutional neural network-based diagnostics for rotating machinery Articles View online Schließen > Access Full access (via DOI) https://papers.phmsociety.org/index.php/phmconf/article/view/1132 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. 2020 Published in: Prognostics and Health Management Society (12. : 2020 : Online): PHM 2020 ; 2020 Pecht, Michael An Editorial From the Editor-in-Chief of the IEEE ACCESS, at the End of his Six Year Term Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2018 Published in: IEEE Access
Pecht, Michael [Other] Contamination of electronic assemblies Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla.: CRC Press, 2003 Published in: Electronic packaging series
Pecht, Michael [Other] Electronic packaging materials and their properties Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, c1999 Published in: The Electronic packaging series
Pecht, Michael [Editor] Handbook of electronic package design Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. New York [u.a.]: Dekker, 1991 Published in: Mechanical engineering ; 7600
Lall, Pradeep [Author] ; Pecht, Michael [Other]; Hakim, Edward B. [Other] Influence of temperature on microelectronics and system reliability Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, 1997 Published in: The electronic packaging series
Ganesan, Sanka [Editor]; Pecht, Michael [Other] Lead-free electronics Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken, NJ: Wiley-Interscience [u.a.], 2006
Pecht, Judy [Author]; Pecht, Michael [Author] Long-term non-operating reliability of electronic products Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, c1995
Pecht, Michael G. [Other]; Wong, Yeun Tsun [Other]; Pecht, Michael [Editor] Advanced routing of electronic modules Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton [u.a.]: CRC Press, c1996 Published in: Electronic packages, interconnects, and product series
Ardebili, Haleh [Author]; Pecht, Michael [Author] Encapsulation technologies for electronic applications Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Oxford: Elsevier, 2009 Published in: Materials and processes for electronic application
Pecht, Michael [Author]; Radojcic, Riko [Author]; Rao, Gopal K. [Author] Guidebook for managing silicon chip reliability Books Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Boca Raton, Fla. [u.a.]: CRC Press, 1999 Published in: The electronic packaging series
Kapur, Kailash C. [Author] ; Pecht, Michael [Contributor] Reliability engineering Books View online Schließen > Access https://learning.oreilly.com/library/view/-/9781118841792/?ar Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken, N.J.: J. Wiley & Sons, c2014 Published in: Wiley series in systems engineering and management
Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on Reliability Engineering 4. 2019 Rom 4th International Conference on Reliability Engineering (ICRE 2019) : 20-22 November 2019, Rome, Italy Books View online Schließen > Access http://iopscience.iop.org/1757-899X/836/1 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Bristol]: IOP Publishing, 06 May 2020 Published in: Institute of Physics: IOP conference series / Materials science and engineering ; 836
Pecht, Michael [Editor]; Kyeong, San [Editor] Electrical connectors : design, manufacture, test, and selection Books View online Schließen > Access https://ieeexplore.ieee.org/servlet/opac?bknumber=9295062 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken: Wiley IEEE Press, 2021
Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on Reliability Engineering 3. 2018 Barcelona 2018 3rd International Conference on Reliability Engineering : 24-26 November 2018, Barcelona, Spain Books View online Schließen > Access http://iopscience.iop.org/1757-899X/575/1 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Bristol]: IOP Publishing, [2019] Published in: Institute of Physics: IOP conference series / Materials science and engineering ; 575
Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on System Reliability and Safety 4. 2019 Rom 2019 4th International Conference on System Reliability and Safety : ICSRS 2019 : Rome, Italy, 20-22 November 2019 Books View online Schließen > Access Full access (via DOI) Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Piscataway, NJ: IEEE, 2019
Pecht, Michael [Organizer]; Zio, Enrico [Organizer] ; International Conference on System Reliability and Safety 3. 2018 Barcelona 2018 3rd International Conference on System Reliability and Safety : ICSRS 2018 : Barcelona, Spain, 24-26 November 2018 : proceedings Books View online Schließen > Access https://ieeexplore.ieee.org/servlet/opac?punumber=8672656 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Piscataway, NJ: IEEE, 2018
Pecht, Michael [Editor]; Kang, Myeongsu [Editor] Prognostics and health management of electronics : fundamentals, machine learning, and the internet of things Books View online Schließen > Access https://ieeexplore.ieee.org/book/8470990?bknumber=8470990 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Hoboken, NJ: Wiley-IEEE Press, 2018
Zhao, Tingdi [Editor]; Pecht, Michael [Editor]; Zhang, Shunong [Editor] ; Prognostics and System Health Management Conference 6. 2015 Peking 2015 PHM-Beijing : proceedings of 2015 Prognostics and System Health Management Conference : 21-23 October 2015, Vision Hotel, Beijing, China Books View online Schließen > Access http://ieeexplore.ieee.org/servlet/opac?punumber=7368255 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. [Piscataway, NJ]: IEEE, 2015
Chung, Henry Shu-hung [Editor]; Wang, Huai [Editor]; Blaabjerg, Frede [Editor]; Pecht, Michael [Editor] Reliability of power electronic converter systems Books View online Schließen > Access https://ebookcentral.proquest.com/lib/slub/detail.action?docID=4332367 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. London: The Institution of Engineering and Technology, 2016 Published in: IET power and energy series ; 80
Lee, Namkyoung [Author]; Azarian, Michael H. [Author]; Pecht, Michael [Author] Octave-band filtering for convolutional neural network-based diagnostics for rotating machinery Articles View online Schließen > Access Full access (via DOI) https://papers.phmsociety.org/index.php/phmconf/article/view/1132 Show more show less Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. 2020 Published in: Prognostics and Health Management Society (12. : 2020 : Online): PHM 2020 ; 2020
> Access Full access (via DOI) https://papers.phmsociety.org/index.php/phmconf/article/view/1132 Show more show less
Pecht, Michael An Editorial From the Editor-in-Chief of the IEEE ACCESS, at the End of his Six Year Term Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Institute of Electrical and Electronics Engineers (IEEE), 2018 Published in: IEEE Access
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