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  1. Roder, Melissa [Author] ; Danilewsky, Andreas N. [Degree supervisor]; Wellmann, Peter [Degree supervisor]; Fiederle, Michael [Degree supervisor] Albert-Ludwigs-Universität Freiburg Fakultät für Umwelt und Natürliche Ressourcen

    Global defect distribution and their influence on the local real structure of 4H-SiC

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    Freiburg: Universität, 2021

  3. Nguyen, Binh Duong [Author]; Roder, Melissa [Author]; Danilewsky, Andreas [Author]; Steiner, Johannes [Author]; Wellmann, Peter [Author]; Sandfeld, Stefan [Author]

    Automated analysis of X-ray topography of 4H-SiC wafers: Image analysis, numerical computations, and artificial intelligence approaches for locating and characterizing screw dislocations

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    Springer, 2023

    Published in: Journal of materials research 38, 1254-1265 (2023). doi:10.1557/s43578-022-00880-z

  4. Steiner, Johannes [Author]; Nguyen, Binh Duong [Author]; Roder, Melissa [Author]; Danilewsky, Andreas N. [Author]; Sandfeld, Stefan [Author]; Wellmann, Peter J. [Author]

    Applicability of a Flat-Bed Birefringence Setup for the Determination of Threading Dislocations of Silicon Carbide Wafers

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    Trans Tech Publ., 2022

    Published in: Materials science forum 1062, 113 - 118 (2022). doi:10.4028/p-y8n42h

  5. Steiner, Johannes [Author]; Roder, Melissa [Author]; Nguyen, Binh Duong [Author]; Sandfeld, Stefan [Author]; Danilewsky, Andreas N. [Author]; Wellmann, Peter [Author]

    Analysis of the basal plane dislocation density and thermomechanical stress during 100 mm PVT growth of 4H-SiC

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    Basel: MDPI, 2019

    Published in: Materials ; 12, 13 (2019), 2207

  6. Gradwohl, Kevin-P. [Author]; Danilewsky, Andreas N. [Author]; Roder, Melissa [Author]; Schmidbauer, Martin [Author]; Janicskó-Csáthy, József [Author]; Gybin, Alexander [Author]; Abrosimov, Nikolay [Author]; Sumathi, R. Radhakrishnan [Author]

    Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

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    GEO-LEOe-docs (FID GEO), 2020

  7. Wellmann, Peter J. [Author]; Arzig, Matthias [Author]; Roder, Melissa [Author]; Danilewsky, Andreas N. [Author]; Nguyen, Binh Duong [Author]; Sandfeld, Stefan [Author]; Ihle, Jonas [Author]; Kollmuss, Manuel [Author]; Steiner, Johannes [Author]; Mauceri, Marco [Author]; Crippa, Danilo [Author]; La Via, Francesco [Author]; Salamon, Michael [Author]; Uhlmann, Norman [Author]

    Review of Sublimation Growth of SiC Bulk Crystals

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    Forschungszentrum Jülich: JuSER (Juelich Shared Electronic Resources), 2022

    Published in: Materials science forum 1062, 104 - 112 (2022). doi:10.4028/p-05sz31

  8. Nguyen, Binh Duong; Roder, Melissa; Danilewsky, Andreas; Steiner, Johannes; Wellmann, Peter; Sandfeld, Stefan

    Automated analysis of X-ray topography of 4H-SiC wafers: Image analysis, numerical computations, and artificial intelligence approaches for locating and characterizing screw dislocations

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    Springer Science and Business Media LLC, 2023

    Published in: Journal of Materials Research

  16. Gradwohl, Kevin-P.; Danilewsky, Andreas N.; Roder, Melissa; Schmidbauer, Martin; Janicskó-Csáthy, József; Gybin, Alexander; Abrosimov, Nikolay; Sumathi, R. Radhakrishnan

    Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

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    International Union of Crystallography (IUCr), 2020

    Published in: Journal of Applied Crystallography

  18. Wellmann, Peter J.; Arzig, Matthias; Ihle, Jonas; Kollmuss, Manuel; Steiner, Johannes; Mauceri, Marco; Crippa, Danilo; La Via, Francesco; Salamon, Michael; Uhlmann, Norman; Roder, Melissa; Danilewsky, Andreas N.; Nguyen, Binh Duong; Sandfeld, Stefan

    Review of Sublimation Growth of SiC Bulk Crystals

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    Trans Tech Publications, Ltd., 2022

    Published in: Materials Science Forum

  19. Seeman, Philip; Schwarz, Johannes; Chen, Jiang-Fan; Szechtman, Henry; Perreault, Melissa; McKnight, G. Stanley; Roder, John C.; Quirion, Rémi; Boksa, Patricia; Srivastava, Lalit K.; Yanai, Kazuhiko; Weinshenker, David; Sumiyoshi, Tomiki

    Psychosis pathways converge via D2High dopamine receptors

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    Wiley, 2006

    Published in: Synapse

  20. Paez, Vincent; Barrett, W Bradley; Deng, Xiaojun; Diaz-Amigo, Carmen; Fiedler, Katherine; Fuerer, Christophe; Hostetler, Gregory L; Johnson, Phil; Joseph, George; Konings, Erik J M; Lacorn, Markus; Lawry, John; Liu, Huafen; Marceau, Eric; Mastovska, Katerina; Monteroso, Lisa; Pan, Shang-Jing; Parker, Christine; Phillips, Melissa Meaney; Popping, Bert; Radcliffe, Scott; Rimmer, Catherine A; Roder, Martin; Schreiber, Andre; [...]

    AOAC SMPR® 2016.002

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    Oxford University Press (OUP), 2016

    Published in: Journal of AOAC INTERNATIONAL