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  1. Uebel, David [Author]; Kayser, Stefan [Author]; Markurt, Toni [Author]; Ernst, Owen C. [Author]; Teubner, Thomas [Author]; Boeck, Torsten [Author] ; Weierstraß-Institut für Angewandte Analysis und Stochastik

    Fast Raman mapping and in situ TEM observation of metal induced crystallization of amorphous silicon

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    Berlin: Weierstraß-Institut für Angewandte Analysis und Stochastik Leibniz-Institut im Forschungsverbund Berlin e.V., 2020

    Published in: Weierstraß-Institut für Angewandte Analysis und Stochastik: Preprint ; 2772

  2. Ernst, Owen C. [Author]; Uebel, David [Author]; Kayser, Stefan [Author]; Lange, Felix [Author]; Teubner, Thomas [Author]; Boeck, Torsten [Author] ; Weierstraß-Institut für Angewandte Analysis und Stochastik

    Revealing all states of dewetting of a thin gold layer on a silicon surface by nanosecond laser conditioning

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    Berlin: Weierstraß-Institut für Angewandte Analysis und Stochastik Leibniz-Institut im Forschungsverbund Berlin e.V., 2020

    Published in: Weierstraß-Institut für Angewandte Analysis und Stochastik: Preprint ; 2777

  3. UEBEL, THOMAS E.

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    Oxford University Press (OUP), 1995

    Published in: Mind