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Wuu, Shou-Gwo [Author] ; Müller, Jörg [Other]; Bauhofer, Wofgang [Other] Technische Universität Hamburg-Harburg Arbeitsbereich Halbleitertechnologie

Laser induced lateral epitaxy on silicon-on-insulator - [Als Ms. gedr.]

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Düsseldorf: VDI-Verl., 1992

Published in: Verein Deutscher Ingenieure: Fortschrittberichte VDI / 9 ; 143
Kan Yuan Lee; Yean Kuen Pang; Chii-Wen Chen; Mong Song Liang; Shou Gwo Wuu

Rapid thermal annealing on the characteristics of polysilicon thin-film transistors in practical TFT SRAM process

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Institute of Electrical and Electronics Engineers (IEEE), 1997

Published in: IEEE Transactions on Electron Devices
Jiann-Ruey Chen; Bor-Yir Chen; Shou-Gwo Wuu; Yuen-Chung Liu

Identification of diffusing species during metal silicide oxidation by Rutherford backscattering spectrometry

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Elsevier BV, 1986

Published in: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Wuu, Shou-Gwo; Chen, Hsin-Li; Chien, Ho-Ching; Enquist, Paul; Guidash, R. Michael; McCarten, John

A Review of 3-Dimensional Wafer Level Stacked Backside Illuminated CMOS Image Sensor Process Technologies

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Institute of Electrical and Electronics Engineers (IEEE), 2022

Published in: IEEE Transactions on Electron Devices
Chao, Calvin Yi-Ping; Chen, Yi-Che; Chou, Kuo-Yu; Sze, Jhy-Jyi; Hsueh, Fu-Lung; Wuu, Shou-Gwo

Extraction and Estimation of Pinned Photodiode Capacitance in CMOS Image Sensors

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Institute of Electrical and Electronics Engineers (IEEE), 2014

Published in: IEEE Journal of the Electron Devices Society
Dun-Nian Yaung; Shou-Gwo Wuu; Yean-Kuen Fang; Wang, C.S.; Chien-Hsien Tseng; Mon-Song Lian

Nonsilicide source/drain pixel for 0.25-/spl mu/m CMOS image sensor

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Institute of Electrical and Electronics Engineers (IEEE), 2001

Published in: IEEE Electron Device Letters
Yaung, Dun-Nian; Fang, Yean-Kuen; Lee, Kan-Yuan; Hwang, Kuo-Ching; Wuu, Shou-Gwo; Liang, Mong-Song

A Comparison of Behaviors between Hydrogenated/Unhydrogenated Polysilicon Thin Film Transistors under Electric Stress

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IOP Publishing, 2000

Published in: Japanese Journal of Applied Physics
Lee, Kan Yuan; Fang, Yean Kuen; Chen, Chii Wen; Yaung, Dung Niang; Wuu, Kuen Hsien; Ho, Jyh Jier; Liang, Mong Song; Wuu, Shou Gwo

The Impacts of Back-End High Temperature Thermal Treatments on the Characteristics and Gate Oxide Reliability of Thin Film Transistor in Ultra Large Scale Integrated Circuit Process

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IOP Publishing, 1997

Published in: Japanese Journal of Applied Physics
Mori, Kazuya; Yasuda, Naoto; Miyauchi, Ken; Isozaki, Toshiyuki; Takayanagi, Isao; Nakamura, Junichi; Chien, Ho-Ching; Fu, Ken; Wuu, Shou-Gwo; Berkovich, Andrew; Chen, Song; Gao, Wei; Liu, Chiao

A 4.0 μm Stacked Digital Pixel Sensor Operating in a Dual Quantization Mode for High Dynamic Range

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Institute of Electrical and Electronics Engineers (IEEE), 2022

Published in: IEEE Transactions on Electron Devices
Kong-Beng Thei; Wen-Chau Liu; Hung-Ming Chuang; Kun-Wei Lin; Chin-Chuan Cheng; Chin-Hsiung Ho; Chi-Wen Su; Shou-Gwo Wuu; Chung-Shu Wang

A novel double ion-implant (DII) Ti-salicide technology for high-performance sub-0.25-μm CMOS devices applications

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Institute of Electrical and Electronics Engineers (IEEE), 2001

Published in: IEEE Transactions on Electron Devices
Wen-Chau Liu; Kong-Beng Thei; Wei-Chou Wang; Hsi-Jen Pan; Shou-Gwo Wuu; Ming-Ta Lei; Chung-Shu Wang; Shiou-Ying Cheng

A new and improved borderless contact (BLC) structure for high-performance Ti-salicide in sub-quarter micron CMOS devices

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Institute of Electrical and Electronics Engineers (IEEE), 2000

Published in: IEEE Electron Device Letters
Ikeno, Rimon; Mori, Kazuya; Uno, Masayuki; Miyauchi, Ken; Isozaki, Toshiyuki; Takayanagi, Isao; Nakamura, Junichi; Wuu, Shou-Gwo; Bainbridge, Lyle; Berkovich, Andrew; Chen, Song; Chilukuri, Ramakrishna; Gao, Wei; Tsai, Tsung-Hsun; Liu, Chiao

A 4.6-μm, 127-dB Dynamic Range, Ultra-Low Power Stacked Digital Pixel Sensor With Overlapped Triple Quantization

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Institute of Electrical and Electronics Engineers (IEEE), 2022

Published in: IEEE Transactions on Electron Devices
Thei, Kong-Beng; Chuang, Hung-Ming; Yu, Kuo-Hui; Liu, Wen-Chau; Liu, Rong-Chau; Lin, Kun-Wei; Su, Chi-Wen; Ho, Chin-Shiung; Wuu, Shou-Gwo; Wang, Chung-Shu

On the high-performance Ti-salicide ULSI CMOS devices prepared by a borderless contact technique and double-implant structure

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IOP Publishing, 2002

Published in: Semiconductor Science and Technology

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