Media type: Book Title: Leakage in nanometer CMOS technologies Contributor: Narendra, Siva G. [Hrsg.] Published: New York, NY: Springer, 2006 Published in: Series on integrated circuits and systems Extent: X, 307 S.; graph. Darst Language: English ISBN: 0387257373 Origination: RVK notation: ZN 4960 : MOS-, MIS-Schaltungen (hier auch CTD-Schaltungen; Eimerkettenschaltungen; CMOS-Schaltungen...) Keywords: CMOS > Nanometerbereich > Leckage Footnote:
Departmental Library DrePunct – open access area Shelf-mark: ZN 4960 N225 Item ID: 31679672 Due date: 2024/04/05 Status: On loan, place hold > Reservation possible ‒ please log in