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Jargon, Jeffrey [Organizer] ; Spirito, Marco [Organizer] ; ARFTG Microwave Measurement Conference, 99., 2022, Denver, Colo. [Author] ; Automatic RF Techniques Group [Organizer]

From fundamental to cutting-edge microwave measurement techniques to support 6G and beyond

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  • Media type: E-Book; Conference Proceedings
  • Title: From fundamental to cutting-edge microwave measurement techniques to support 6G and beyond : 99th ARFTG Microwave Measurement Conference : June 24th 2022, Hyatt Regency at Colorado Convention Center, Denver, Denver, Colorado
  • Other titles: Abweichender Titel: 2022 99th ARFTG Microwave Measurement Conference (ARFTG)
  • Contributor: Jargon, Jeffrey [Organizer] ; Spirito, Marco [Organizer, Editor]
  • Corporation: Automatic RF Techniques Group [Organizer]
  • Event: ARFTG Microwave Measurement Conference, 99., 2022, Denver, Colo. [Author]
  • Published: [Piscataway, NJ]: IEEE, 2022
  • Extent: 1 Online-Ressource; Illustrationen
  • Language: English
  • DOI: 10.1109/ARFTG54656.2022
  • ISBN: 9781665468947
  • Identifier:
  • Keywords: Halbleiterbauelement > Wafer > Zerstörungsfreie Werkstoffprüfung
  • Origination:
  • Footnote: Literaturangaben