Media type: Book Title: Infrared characterization for microelectronics Contributor: Lau, W. S. [Author] imprint: Singapore [u.a.]: World Scientific, 1999 Extent: X, 160 S; graph. Darst Language: English ISBN: 9810223528 RVK notation: UH 6000 : Infrarot- und Ferninfrarotspektroskopie, Fouriertransformationsinfrarotspektroskopie (FTIR) insgesamt, Allgemeines ZN 3400 : Allgemeines Keywords: Infrarotspektroskopie Origination: Footnote: Literaturangaben
Departmental Library DrePunct – stack Shelf-mark: 2000 8 019134 001 Item ID: 10087554 Status: Loanable, place order > Ordering possible ‒ please log in