Lloyd, James R.
[Editor];
Yost, Frederick G.
[Other];
Ho, Paul S.
[Other]
;
Materials Research Society,
Symposium on Materials Reliability Issues in Microelectronics 1 1991 Anaheim, Calif
Materials reliability issues in microelectronics
:
symposium held April 30-May 3, 1991, Anaheim, California, U.S.A
- [2. printing]