Media type: Book Title: Positron annihilation in semiconductors : defect studies; with 20 tables Contributor: Krause-Rehberg, Reinhard [Author]; Leipner, Hartmut S. [Author] imprint: Berlin; Heidelberg; New York; Barcelona; Hong Kong; London; Milan; Paris; Singapore; Tokyo: Springer, 1999 Published in: Springer series in solid-state sciences ; 127 Extent: XV, 378 S.; graph. Darst Language: English ISBN: 3540643710 RVK notation: UP 3200 : Transportprozesse in Halbleitern, Gunn-Element, Gunn-Effekt Keywords: Halbleiter > Gitterbaufehler > Elektron-Positron-Vernichtung Origination: Footnote: Literaturverz. S. [353] - 374