Media type: Book Title: Defects in microelectronic materials and devices Contributor: Fleetwood, Daniel M. [Author]; Pantelides, Sokrates T. [Other]; Schrimpf, Ronald D. [Other]; Pantelides, Sokrates [Other]; Schrimpf, Ronald Donald [Other] imprint: Boca Raton, Fla. [u.a.]: CRC Press, 2009 Extent: XVI, 753 S.; Ill., graph. Darst Language: English ISBN: 9781420043761 RVK notation: ZN 4040 : Zuverlässigkeit elektronischer Bauelemente und Geräte Keywords: Mikroelektronik > Werkstoff Origination: Footnote: Includes bibliographical references and index
Departmental Library DrePunct – open access area Shelf-mark: ZN 4040 F595 Item ID: 33117967 Status: Loanable