Media type: E-Book; Conference Proceedings Title: Reliability of compound semiconductors digest : ROCS Workshop, 2007 ; 14 Oct. 2007, Portland, Oregon Corporation: JEDEC, Solid State Technology Association, Committee on GaAs Reliability and Quality Standards ; IEEE Electron Devices Society imprint: Piscataway, NJ: IEEE, 2007 Extent: Online-Ressource Language: English ISBN: 0790801159; 9780790801155 Keywords: Semiconductors Congresses ; Semiconductors Reliability Congresses ; Gallium arsenide semiconductors Congresses ; Konferenzschrift Origination: Footnote: IEEE catalog number: 07TH8986 Parallel als Buch-Ausg. erschienen