Media type: Book Title: Reliability and radiation effects in compound semiconductors Contains: Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles. Literaturangaben Contributor: Johnston, Allan [Author]; Johnston, Allan John [Other] imprint: Hackensack [u.a.]: World Scientific, 2010 Extent: XII, 363 S.; graph. Darst Language: English ISBN: 981427710X; 9789814277105 RVK notation: ZN 4040 : Zuverlässigkeit elektronischer Bauelemente und Geräte ZN 4060 : Strahleneinwirkung; Elektromagnetischer Impuls, Härten elektronischer Schaltungen Keywords: Verbindungshalbleiter > Zuverlässigkeit > Strahlenschaden Origination: Footnote:
Departmental Library DrePunct – open access area Shelf-mark: ZN 4060 J72 Item ID: 32888608 Status: Loanable