Media type: Book Title: Reliability of nanoscale circuits and systems : methodologies and circuit architectures Contributor: Stanisavljevic, Milos [Author]; Schmid, Alexandre [Author]; Leblebici, Yusuf [Author] Published: New York; Heidelberg [u.a.]: Springer, c 2011 Issue: 1. ed. Extent: XXVII, 195 S.; Ill., graph. Darst; 235 mm x 155 mm Language: English ISBN: 9781441962164; 1441962166 Publisher or production numbers: 12784110 Origination: RVK notation: ZN 3700 : Mikromechanik (hier auch Nanotechnologie) ZN 4040 : Zuverlässigkeit elektronischer Bauelemente und Geräte Keywords: Nanoelectromechanical systems Reliability ; Nanoelectronics ; Nanoelectromechanical systems ; Reliability Footnote: Literaturverz. S. 177 - 190
Departmental Library DrePunct – open access area Shelf-mark: ZN 4040 S486 Item ID: 32894045 Status: Loanable