Media type: Book Title: Electromigration in ULSI interconnections Contributor: Tan, Cher Ming [Author] Published: New Jersey, NJ [u.a.]: World Scientific, 2010 Published in: International series on advances in solid state electronics and technology Contains: Extent: XIX, 291 S.; Ill., graph. Darst; 24 cm Language: English ISBN: 9789814273329; 9814273325 Origination: RVK notation: ZN 4952 : Schaltungen der Grösstintegration (VLSI; ULSI) Keywords: Integrated circuits Ultra large scale integration ; Electrodiffusion Footnote: The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf
Bestand der TU Dresden Shelf-mark: 2011 8 000687 Item ID: 11284747N Status: Verfügbarkeit bitte in Prof Konstruktion Feinwerktechnik erfragen.