• Media type: Book
  • Title: Electromigration in ULSI interconnections
  • Contributor: Tan, Cher Ming [Author]
  • Published: New Jersey, NJ [u.a.]: World Scientific, 2010
  • Published in: International series on advances in solid state electronics and technology
  • Contains:
  • Extent: XIX, 291 S.; Ill., graph. Darst; 24 cm
  • Language: English
  • ISBN: 9789814273329; 9814273325
  • Origination:
  • RVK notation: ZN 4952 : Schaltungen der Grösstintegration (VLSI; ULSI)
  • Keywords: Integrated circuits Ultra large scale integration ; Electrodiffusion
  • Footnote: The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf

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  • Shelf-mark: 2011 8 000687
  • Item ID: 11284747N