• Media type: E-Book; Conference Proceedings
  • Title: Reliability physics 1980 : 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980
  • Corporation: IEEE Electron Devices Society ; IEEE Reliability Society
  • Published: New York: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 2011
    [S.l.]: HathiTrust Digital Library
  • Other titles: Nebentitel: IEEE 1980 International Reliability Physics
    Variant title from electronic version: Reliability Physics Symposium, 1980, 18th Annual
  • Extent: 1 Online-Ressource (vii, 339 pages); illustrations, portraits
  • Language: English
  • Place of reproduction: [S.l.]: HathiTrust Digital Library
  • Reproduction note: Electronic reproduction
  • Origination:
  • Keywords: Integrated circuits Testing Congresses ; Semiconductors Testing Congresses ; Integrated circuits Reliability Congresses ; Semiconductors Reliability Congresses ; Konferenzschrift
  • Footnote: "IEEE catalog no. 80CH1531-3
    Includes bibliographical references
    Use copy Restrictions unspecified star MiAaHDL