• Media type: E-Article
  • Title: Determination of the third- and fifth-order nonlinear refractive indices in InN thin films
  • Contributor: Zhang, Z. Q.; He, W. Q.; Gu, C. M.; Shen, W. Z.; Ogawa, H.; Guo, Q. X.
  • Published: AIP Publishing, 2007
  • Published in: Applied Physics Letters
  • Extent:
  • Language: English
  • DOI: 10.1063/1.2813637
  • ISSN: 0003-6951; 1077-3118
  • Keywords: Physics and Astronomy (miscellaneous)
  • Abstract: <jats:p>We have combined the reflection and transmission Z-scan (RZ- and TZ-scans) techniques under femtosecond laser at 800nm to extract both the third- and fifth-order nonlinear refractive indices (n2 and n4) in InN thin films. The observation of the nonlinear refractive index saturation in the intensity-dependent RZ-scan measurement indicates the existence of the fifth-order effect. By the aid of the TZ-scan, the fifth-order nonlinear effect has been enhanced by enlarging the cascaded contribution from the increased laser interaction length, where large n2 of −2.5×10−11cm2∕W and n4 of 2.1×10−19cm4∕W2 have been determined.</jats:p>
  • Description: <jats:p>We have combined the reflection and transmission Z-scan (RZ- and TZ-scans) techniques under femtosecond laser at 800nm to extract both the third- and fifth-order nonlinear refractive indices (n2 and n4) in InN thin films. The observation of the nonlinear refractive index saturation in the intensity-dependent RZ-scan measurement indicates the existence of the fifth-order effect. By the aid of the TZ-scan, the fifth-order nonlinear effect has been enhanced by enlarging the cascaded contribution from the increased laser interaction length, where large n2 of −2.5×10−11cm2∕W and n4 of 2.1×10−19cm4∕W2 have been determined.</jats:p>
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