• Media type: E-Article
  • Title: Integrated Circuit Design: Degradation Delay Model Extension to CMOS Gates
  • Contributor: Juan-Chico, Jorge; Bellido, Manuel J.; Ruiz-de-Clavijo, Paulino; Acosta, Antonio J.; Valencia, Manuel
  • Published in: Integrated Circuit Design
  • Published: Springer Berlin Heidelberg, 2000
  • Language: Not determined
  • DOI: 10.1007/3-540-45373-3_15
  • ISSN: 0302-9743
  • Footnote: