Media type: E-Article Title: Applications of finite element methods for reliability study of ULSI interconnections Contributor: Tan, Cher Ming; Li, Wei; Gan, Zhenghao imprint: Elsevier BV, 2012 Published in: Microelectronics Reliability Language: English DOI: 10.1016/j.microrel.2011.09.015 ISSN: 0026-2714 Keywords: Electrical and Electronic Engineering ; Surfaces, Coatings and Films ; Safety, Risk, Reliability and Quality ; Condensed Matter Physics ; Atomic and Molecular Physics, and Optics ; Electronic, Optical and Magnetic Materials Origination: Footnote: