Media type: E-Article Title: New insight on negative bias temperature instability degradation with drain bias of 28nm High-K Metal Gate p-MOSFET devices Contributor: Liao, Miao; Gan, Zhenghao imprint: Elsevier BV, 2014 Published in: Microelectronics Reliability Language: English DOI: 10.1016/j.microrel.2014.05.010 ISSN: 0026-2714 Keywords: Electrical and Electronic Engineering ; Surfaces, Coatings and Films ; Safety, Risk, Reliability and Quality ; Condensed Matter Physics ; Atomic and Molecular Physics, and Optics ; Electronic, Optical and Magnetic Materials Origination: Footnote: