Media type: E-Article Title: A time to failure evaluation of AlGaN/GaN HEMT transistors for RF applications Contributor: Latry, Olivier; Moultif, Niemat; Joubert, Eric; Ndiaye, Mohamed Published: Elsevier BV, 2022 Published in: e-Prime - Advances in Electrical Engineering, Electronics and Energy, 2 (2022), Seite 100062 Language: English DOI: 10.1016/j.prime.2022.100062 ISSN: 2772-6711 Origination: Footnote: Access State: Open Access