Media type: E-Article Title: The Effect of the Transverse Sensitivity on Measurement of the Piezoresistive Coefficients of Silicon Contributor: Cho, Chun-Hyung; Jaeger, Richard C.; Suhling, Jeffrey C. Published: IOP Publishing, 2008 Published in: Japanese Journal of Applied Physics, 47 (2008) 5R, Seite 3647 Language: Without Specification DOI: 10.1143/jjap.47.3647 ISSN: 0021-4922; 1347-4065 Keywords: General Physics and Astronomy ; General Engineering Origination: Footnote: