• Media type: E-Article
  • Title: A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs
  • Contributor: Huang, Daming; Liu, W. J.; Liu, Zhiying; Liao, C. C.; Zhang, Li-Fei; Gan, Zhenghao; Wong, Waisum; Li, Ming-Fu
  • Published: Institute of Electrical and Electronics Engineers (IEEE), 2009
  • Published in: IEEE Transactions on Electron Devices
  • Extent: 267-274
  • Language: Not determined
  • DOI: 10.1109/ted.2008.2010585
  • ISSN: 0018-9383
  • Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials
  • Footnote: