Media type: E-Article Title: A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs Contributor: Huang, Daming; Liu, W. J.; Liu, Zhiying; Liao, C. C.; Zhang, Li-Fei; Gan, Zhenghao; Wong, Waisum; Li, Ming-Fu Published: Institute of Electrical and Electronics Engineers (IEEE), 2009 Published in: IEEE Transactions on Electron Devices Extent: 267-274 Language: Not determined DOI: 10.1109/ted.2008.2010585 ISSN: 0018-9383 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Footnote: