• Media type: E-Article
  • Title: Two-Dimensional Critical Point Configuration Graphs
  • Contributor: Lee, R. Nackman
  • Published: Institute of Electrical and Electronics Engineers (IEEE), 1984
  • Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence
  • Extent: 442-450
  • Language: Not determined
  • DOI: 10.1109/tpami.1984.4767549
  • ISSN: 0162-8828
  • Keywords: Applied Mathematics ; Artificial Intelligence ; Computational Theory and Mathematics ; Computer Vision and Pattern Recognition ; Software
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