Media type: E-Article Title: Two-Dimensional Critical Point Configuration Graphs Contributor: Lee, R. Nackman Published: Institute of Electrical and Electronics Engineers (IEEE), 1984 Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence, PAMI-6 (1984) 4, Seite 442-450 Language: Not determined DOI: 10.1109/tpami.1984.4767549 ISSN: 0162-8828 Keywords: Applied Mathematics ; Artificial Intelligence ; Computational Theory and Mathematics ; Computer Vision and Pattern Recognition ; Software Origination: Footnote: