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  1. IEEE Electron Devices Society, International Reliability Physics Symposium

    Reliability physics : annual proceedings

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    New York, NY: IEEE, 1974-1989 / 12.1974 - 27.1989

  2. Microelectronics reliability

    Amsterdam [u.a.]: Elsevier, 1962- ; Oxford [u.a.]: Pergamon Press, anfangs / 1.1962 -

  3. Reliability engineering & system safety

    London [u.a.]: Elsevier Science, 1988- / 20.1988 - 96.2011; Vol. 97.2012 -

  4. Institute of Electrical and Electronics Engineers

    IEEE transactions on reliability : a publication of the IEEE Reliability Society and journal of the ASQ Electronics Division

    Journals / Newspapers / Series

    New York, NY: IEEE, 1963- / 12.1963 -