TY - GEN

AU - Jelinek, Alexander

AU - Zak, Stanislav

AU - Alfreider, Markus

AU - Kiener, Daniel

TI - High‐Throughput Micromechanical Testing Enabled by Optimized Direct Laser Writing

PB - Wiley

SN - 1438-1656

SN - 1527-2648

PY - 2023

ER -