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  1. Gercbach, Ilʹja B. [Author]; Kordonskij, Chaim B. [Author]

    Models of failure

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    Berlin [u.a.]: Springer, 1969

    Published in: Ingenieurwissenschaftliche Bibliothek

  2. Rathore, Hazara S. [Editor]; Mathad, G. S. [Other] ; Symposium on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown 1991 Phoenix, Ariz., Electrochemical Society, Electrochemical Society Dielectric Science and Technology Division, Electrochemical Society Electronics Division, Symposium on Laser Process for Microelectronic Applications 1991 Phoenix, Ariz.

    Proceedings of the Symposia on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown and Laser Process for Microelectronic Applications : [... joint volume of conference papers]

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    Pennington, NJ: Electrochemical Society, 1992

    Published in: Electrochemical Society: Proceedings volume / Electrochemical Society ; 92,4

  3. Høyland, Arnljot [Author]; Rausand, Marvin [Author]

    System reliability theory : models and statistical methods - [2. print.]

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    New York [u.a.]: Wiley, c1994

    Published in: Wiley series in probability and mathematical statistics ; Applied probability and statistics section- A Wiley-Interscience publication

  4. Woschni, Eugen-Georg [Author]

    Näherungsbetrachtungen contra Computerlösungen? : Ein Beitrag zur Diskussion über Lehrinhalte ; [Vortrag gehalten auf der Plenarsitzung der Sächsischen Akademie der Wissenschaften zu Leipzig, am 13.1.2012]

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    Stuttgart; Leipzig: Hirzel, 2012 ; Leipzig: Sächsische Akad. der Wiss., 2012

    Published in: Sächsische Akademie der Wissenschaften zu Leipzig: Sitzungsberichte der Sächsischen Akademie der Wissenschaften zu Leipzig, Technikwissenschaftliche Klasse ; 306

  5. Pecht, Michael [Author]; Radojcic, Riko [Author]; Rao, Gopal K. [Author]

    Guidebook for managing silicon chip reliability

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    Boca Raton, Fla. [u.a.]: CRC Press, 1999

    Published in: The electronic packaging series