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Gan, Zhenghao [Author]; Wong, Waisum [Author]; Liou, Juin J. [Author]

Semiconductor process reliability in practice

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New York [u.a.]: McGraw-Hill, 2013
Amersekera, E. A. [Author]; Campbell, D. S. [Author]

Failure mechanisms in semiconductor devices

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Chichester [u.a.]: Wiley, 1987
Rathore, Hazara S. [Editor]; Mathad, G. S. [Other] ; Symposium on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown 1991 Phoenix, Ariz., Electrochemical Society, Electrochemical Society Dielectric Science and Technology Division, Electrochemical Society Electronics Division, Symposium on Laser Process for Microelectronic Applications 1991 Phoenix, Ariz.

Proceedings of the Symposia on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown and Laser Process for Microelectronic Applications : [... joint volume of conference papers]

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Pennington, NJ: Electrochemical Society, 1992

Published in: Electrochemical Society: Proceedings volume / Electrochemical Society ; 92,4
Strong, Alvin W. [Other]

Reliability wearout mechanisms in advanced CMOS technologies

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Hoboken, N.J.: Wiley [u.a.], 2009

Published in: IEEE Press Series on Microelectronic Systems
Ueda, Osamu [Author]

Reliability and degradation of III-V optical devices

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Boston [u.a.]: Artech House, 1996

Published in: Artech House optoelectronics library
Eliseev, Petr Georgievič [Author] ; Hendzel, Kevin S. [Other]

Reliability problems of semiconductor lasers

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New York, NY: Nova Science Publishers, 1991

Published in: Fizičeskij institut imeni P. N. Lebedeva: Proceedings (Trudy) of the P. N. Lebedev Physics Institute ; 197
Voldman, Steven H. [Author]

Latchup in semiconductor technology

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Chichester [u.a.]: Wiley, 2007
Pecht, Michael [Author]; Radojcic, Riko [Author]; Rao, Gopal K. [Author]

Guidebook for managing silicon chip reliability

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Boca Raton, Fla. [u.a.]: CRC Press, 1999

Published in: The electronic packaging series
Johnston, Allan [Author] ; Johnston, Allan John [Other]

Reliability and radiation effects in compound semiconductors

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Hackensack [u.a.]: World Scientific, 2010
Ker, Ming-Dou [Author]; Hsu, Sheng-Fu [Author]

Transient-induced latchup in CMOS integrated circuits

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Singapore [u.a.]: Wiley [u.a.], 2009
Hanbücken, Margrit [Editor]; Müller, Pierre [Other]; Wehrspohn, Ralf B. [Other]

Mechanical stress on the nanoscale : simulation, material systems and characterization techniques

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Weinheim: Wiley-VCH, 2011
McKerrow, Andrew J. [Other] ; Symposium Materials, Technology and Reliability for Advanced Interconnects and Low k Dielectrics 2003 San Francisco, Calif.

Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 21 - 25, 2003, San Francisco, California, U.S.A. ; [Symposium E, held at the 2003 MRS spring meeting]

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Warrendale, Pa.: Materials Research Society, 2003

Published in: Materials Research Society: Materials Research Society symposium proceedings ; 76600
Harman, George G. [Author]

Wire bonding in microelectronics - [3. ed. fully updated]

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New York, NY [u.a.]: McGraw-Hill, 2010
Harman, George G. [Author]

Wire bonding in microelectronics : materials, processes, reliability, and yield - [2. ed.]

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New York, NY [u.a.]: McGraw-Hill, 1997

Published in: Electronic packaging and interconnection series
JEDEC, Solid State Technology Association Committee on GaAs Reliability and Quality Standards, IEEE Electron Devices Society

Reliability of compound semiconductors digest : ROCS Workshop, 2007 ; 14 Oct. 2007, Portland, Oregon

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Piscataway, NJ: IEEE, 2007
ROCS Workshop (2009 :Greensboro, N.C.), IEEE Electron Devices Society, JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards

2009 ROCS Workshop : proceedings : October 11, 2009, Greensboro, North Carolina

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Piscataway, NJ; s.l.; s.l.: IEEE, 2009
ROCS Workshop (2008 :Monterey, Calif.), IEEE Electron Devices Society, JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards

2008 ROCS Workshop : proceedings : October 12, 2008, Monterey, California

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Piscataway, N.J; s.l.; s.l.: IEEE, 2008
Hanbücken, Margrit [Other]; Muller, Pierre [Other]; Wehrspohn, Ralf B. [Other]

Mechanical stress on the nanoscale : simulation, material systems and characterization techniques

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https://onlinelibrary.wiley.com/doi/book/10.1002/9783527639540

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Weinheim: Wiley-VCH, 2011
International Reliability Physics Symposium (18th :1980 :Las Vegas, Nev.), IEEE Electron Devices Society, IEEE Reliability Society

Reliability physics 1980 : 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980

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New York: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 2011 ; [S.l.]: HathiTrust Digital Library
International Reliability Physics Symposium (16th :1978 :San Diego, Calif.), IEEE Electron Devices Society, IEEE Reliability Group

Reliability physics 1978 : 16th annual proceedings : San Diego, California, April 18-20, 1978

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New York: IEEE Electroni Devices Society, 1978

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