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  1. Rathore, Hazara S. [Editor]; Mathad, G. S. [Other] ; Symposium on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown 1991 Phoenix, Ariz., Electrochemical Society, Electrochemical Society Dielectric Science and Technology Division, Electrochemical Society Electronics Division, Symposium on Laser Process for Microelectronic Applications 1991 Phoenix, Ariz.

    Proceedings of the Symposia on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown and Laser Process for Microelectronic Applications : [... joint volume of conference papers]

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    Pennington, NJ: Electrochemical Society, 1992

    Published in: Electrochemical Society: Proceedings volume / Electrochemical Society ; 92,4

  2. Pecht, Michael [Author]; Radojcic, Riko [Author]; Rao, Gopal K. [Author]

    Guidebook for managing silicon chip reliability

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    Boca Raton, Fla. [u.a.]: CRC Press, 1999

    Published in: The electronic packaging series

  3. McKerrow, Andrew J. [Other] ; Symposium Materials, Technology and Reliability for Advanced Interconnects and Low k Dielectrics 2003 San Francisco, Calif.

    Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 21 - 25, 2003, San Francisco, California, U.S.A. ; [Symposium E, held at the 2003 MRS spring meeting]

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    Warrendale, Pa.: Materials Research Society, 2003

    Published in: Materials Research Society: Materials Research Society symposium proceedings ; 76600

  4. International Reliability Physics Symposium (18th :1980 :Las Vegas, Nev.), IEEE Electron Devices Society, IEEE Reliability Society

    Reliability physics 1980 : 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980

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    New York: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 2011 ; [S.l.]: HathiTrust Digital Library

  5. International Reliability Physics Symposium (16th :1978 :San Diego, Calif.), IEEE Electron Devices Society, IEEE Reliability Group

    Reliability physics 1978 : 16th annual proceedings : San Diego, California, April 18-20, 1978

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    New York: IEEE Electroni Devices Society, 1978