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Kaiser, Kenneth L. [Author]

Electrostatic discharge

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Boca Raton, Fla.: CRC, 2005 ; London: Taylor & Francis, 2005
Korallus, Jens [Author]

Ortsaufgelöste Leckstrom-Messungen an der Silizium-Elektrolyt-Grenzfläche

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2001
Pascoe, Norman [Author]

Reliability technology : principles and practice of failure prevention in electronic systems - [1. publ.]

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Chichester: Wiley, 2011

Published in: Wiley series in quality & reliability engineering
Schaefer, Eugen [Author]

Zuverlässigkeit, Verfügbarkeit und Sicherheit in der Elektronik : eine Brücke von der Zuverlässigkeitstheorie zu den Aufgaben der Zuverlässigkeitspraxis - [1. Aufl.]

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Würzburg: Vogel, 1979
Kronjäger, Otthermann [Author]

Frühausfallphase elektronischer Erzeugnisse - [1. Aufl.]

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Berlin: Verl. Technik, 1987

Published in: Informationselektronik
Crowe, Dana [Editor]; Feinberg, Alec [Other]

Design for reliability

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Boca Raton, Fla. [u.a.]: CRC Press, 2001

Published in: Electronics handbook series
Hellström, Sten [Author]

ESD - the scourge of electronics

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Berlin; Heidelberg [u.a.]: Springer, 1998
Pecht, Judy [Author]; Pecht, Michael [Author]

Long-term non-operating reliability of electronic products

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Boca Raton, Fla. [u.a.]: CRC Press, c1995
Christou, Aris [Editor]

Electromigration and electronic device degradation

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New York, NY [u.a.]: Wiley, 1994
Etherton, Melanie [Author]

Charged device model (CDM) ESD in ICs : physics, modeling, and circuit simulation

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2006 ; Mikrofiche-Ausg.
Stricker, Andreas Daniel [Author]

Technology computer aided design of ESD protection devices

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2001 ; Mikrofiche-Ausg.
Pampuro, V. I. [Other]

Analiz radiocepej i ich schemnoj nadežnosti

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Kiev: Izd. Technika, 1967
Vashchenko, Vladislav A. [Author]; Shibkov, Andrei [Author]

ESD design for analog circuits

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New York, NY; Heidelberg [u.a.]: Springer, 2010
Băjenescu, Titu I. [Author]; Bâzu, Marius I. [Author] ; Băjenescu, Titu-Marius I. [Other]

Component reliability for electronic systems

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Boston, Mass. [u.a.]: Artech House, 2010
Fleetwood, Daniel M. [Author] ; Pantelides, Sokrates T. [Other]; Schrimpf, Ronald D. [Other]; Pantelides, Sokrates [Other]; Schrimpf, Ronald Donald [Other]

Defects in microelectronic materials and devices

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Boca Raton, Fla. [u.a.]: CRC Press, 2009
Semenov, Oleg [Author]; Sarbishaei, Hossein [Author]; Sachdev, Manoj [Author]

ESD protection device and circuit design for advanced CMOS technologies

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[London]: Springer, 2008
Voldman, Steven H. [Author]

ESD : RF technology and circuits

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Chicester [u.a.]: Wiley, 2006
Băjenescu, Titu I. [Author]; Bâzu, Marius I. [Author]

Reliability of electronic components : a practical guide to electronic systems manufactoring ; with 105 tables

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Berlin; Heidelberg [u.a.]: Springer, 1999
Goldberg, Lee H. [Editor]; Middleton, Wendy [Other]

Green electronics green bottom line : environmentally responsible engineering

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Boston, Mass. [u.a.]: Newnes, 2000
Ohring, Milton [Author]

Reliability and failure of electronic materials and devices

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San Diego [u.a.]: Academic Press, 1998

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