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Nakagawa, Toshio [Author]

Stochastic processes : with applications to reliability theory

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London; Heidelberg [u.a.]: Springer, 2011

Published in: Springer series in realibility engineering
Nakagawa, Toshio [Author]

Symphonie concertante - Partitur

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Tokyo: Japan Fed. of Composers, 1991
Nakagawa, Toshio [Author]

Letters from the prison

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Tokyo, Japan: Japan Federation of Composers, [ca. 1985]
Nakagawa, Toshio [Author]

Advanced reliability models and maintenance policies

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London: Springer, 2008

Published in: Springer series in reliability engineering
Nakagawa, Toshio [Author]

Maintenance theory of reliability

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London [Heidelberg]: Springer, 2005

Published in: Springer series in reliability engineering
Nakamura, Syouji [Editor]; Nakagawa, Toshio [Other]

Stochastic reliability modeling, optimization and applications

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Singapore [u.a.]: World Scientific, 2010
Horikoshi, Ryuichi [Author] ; Tanaka, Takahide [Performer]; Horikoshi, Michiko [Performer]; Nakagawa, Toshio [Performer]

Windscape

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1999

Published in: Japanese composers ; 27: 1999 ; 1999
Ito, Kodo [Author]; Nakagawa, Toshio [Author]

Optimal Inspection Models with Their Applications - [1st ed. 2023.]

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https://doi.org/10.1007/978-3-031-22021-0

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Cham: Springer International Publishing, 2023. ; Cham: Imprint: Springer, 2023.

Published in: Springer Series in Reliability Engineering
Mizutani, Satoshi [Author]; Zhao, Xufeng [Author]; Nakagawa, Toshio [Author]

Which-Is-Better (WIB): Problems in Reliability Theory - [1st ed. 2023.]

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https://doi.org/10.1007/978-3-031-27316-2

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Cham: Springer International Publishing, 2023. ; Cham: Imprint: Springer, 2023.

Published in: Springer Series in Reliability Engineering
Nakagawa, Toshio Komponist; Niimi, Tokuhide Komponist; Nishimura, Akira Komponist; Soler, Josep Komponist; Stockhausen, Karlheinz Komponist; Taira, Yoshihisa Komponist

Vibraphone Recital: Ueno, Shiniti - NAKAGAWA, T. / NIIMI, T. / NISHIMURA, A. / SOLER, J. / STOCKHAUSEN, K. (Vibra-Elufa)

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https://univportal.naxosmusiclibrary.com/catalogue/item.asp?cid=ALCD-7227

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ALM Records, 210426

Published in: ALM Records
Hisaishi, Joe Komponist; Mashima, Toshio Komponist; Miyake, Kazunori Komponist; Nakagawa, Eijiro Komponist; Sakuma, Bob Komponist; Saruya, Toshiro Komponist; Tchaikovsky, Pyotr Il'yich Komponist ; Japan Air Self-Defense Force Central Band

BAND RESTORATION 2015 (Japan Air Self-Defense Force Central Band)

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https://univportal.naxosmusiclibrary.com/catalogue/item.asp?cid=00600406691910

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Universal Classics, 160407

Published in: Universal Classics
Nakagawa, Toshio

A summary of discrete replacement policies

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Elsevier BV, 1984

Published in: European Journal of Operational Research
Nakagawa, Toshio

Optimal policy of continuous and discrete replacement with minimal repair at failure

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Wiley, 1984

Published in: Naval Research Logistics Quarterly
Nakagawa, Toshio

Periodic inspection policy with preventive maintenance

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Wiley, 1984

Published in: Naval Research Logistics Quarterly
Nakagawa, Toshio

A SUMMARY OF PERIODIC REPLACEMENT WITH MINIMAL REPAIR AT FAILURE

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The Operations Research Society of Japan, 1981

Published in: Journal of the Operations Research Society of Japan
Nakagawa, Toshio

Periodic and sequential preventive maintenance policies

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Cambridge University Press (CUP), 1986

Published in: Journal of Applied Probability
NAKAGAWA, Toshio

Prediction of Microbial Characters by a Computerized Learning Machine

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Oxford University Press (OUP), 1971

Published in: Agricultural and Biological Chemistry
Nakagawa, Toshio

On Cumulative Damage with Annealing

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Institute of Electrical and Electronics Engineers (IEEE), 1975

Published in: IEEE Transactions on Reliability
Nakagawa, Toshio

Applications of Solubilization to Pharmacy. II : Solubilization of 2-Methyl-1, 4-naphthoquinone : Solubilization of 2-Methyl-1, 4-naphthoquinone

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Pharmaceutical Society of Japan, 1953

Published in: YAKUGAKU ZASSHI
Nakagawa, Toshio

On a Cumulative Damage Model with N Different Components

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Institute of Electrical and Electronics Engineers (IEEE), 1976

Published in: IEEE Transactions on Reliability

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