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Gan, Zhenghao [Author]; Wong, Waisum [Author]; Liou, Juin J. [Author]

Semiconductor process reliability in practice

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New York [u.a.]: McGraw-Hill, 2013
Wu, Dake; Huang, Ru; Wong, Waisum; Wang, Yangyuan

A control-gate-assisted erasing method for a single-poly EEPROM cell with metallic control gate structure

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IOP Publishing, 2009

Published in: Semiconductor Science and Technology
Yan, Han; Xiao, Liang; Haifeng, Zhou; Yinfang, Xie; Waisum, Wong

A 0.8 V low power low phase-noise PLL

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IOP Publishing, 2010

Published in: Journal of Semiconductors
Wu, Dake; Huang, Ru; Wong, Waisum; Wang, Yangyuan

A 0.4-V Low Noise Amplifier Using Forward Body Bias Technology for 5 GHz Application

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Institute of Electrical and Electronics Engineers (IEEE), 2007

Published in: IEEE Microwave and Wireless Components Letters
Wang, Chuan; Liao, Huailin; Li, Chen; Huang, Ru; Wong, Waisum; Zhang, Xin; Wang, Yangyuan

A Wideband Predictive “Double-$\pi$” Equivalent-Circuit Model for On-Chip Spiral Inductors

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Institute of Electrical and Electronics Engineers (IEEE), 2009

Published in: IEEE Transactions on Electron Devices
Han Xiao; Lijie Zhang; Ru Huang; Fei Song; Dake Wu; Huailin Liao; Waisum Wong; Yangyuan Wang

A Novel RF LDMOS Fabricated With Standard Foundry Technology

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Institute of Electrical and Electronics Engineers (IEEE), 2009

Published in: IEEE Electron Device Letters
Huang, Daming; Liu, W. J.; Liu, Zhiying; Liao, C. C.; Zhang, Li-Fei; Gan, Zhenghao; Wong, Waisum; Li, Ming-Fu

A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs

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Institute of Electrical and Electronics Engineers (IEEE), 2009

Published in: IEEE Transactions on Electron Devices
Ortiz-Conde, A.; Gouveia Fernandes, E.D.; Liou, J.; Rofiqul Hassan, M.; Garcia-Sanchez, F.J.; de Mercato, G.; Waisum Wong

A new approach to extract the threshold voltage of MOSFETs

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Institute of Electrical and Electronics Engineers (IEEE), 1997

Published in: IEEE Transactions on Electron Devices
Li, Helen; Zhang, Mealie; Wong, Waisum; Song, Huiyuan; Xu, Wei; Hurat, Philippe; Ding, Hua; Zhang, Yifan; Cote, Michel; Huang, Jason; Lai, Ya-ch

Layout dependent effects analysis on 28nm process

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SPIE, 2015

Published in: SPIE Proceedings
Baoguang Yan; Jingfeng Yang; Zhiliang Xia; Xiaoyan Liu; Gang Du; Ruqi Han; Jinfeng Kang; Liao, C.C.; Zhenghao Gan; Miao Liao; Wang, J.P.; Waisum Wong

Anomalous Negative Bias Temperature Instability Degradation Induced by Source/Drain Bias in Nanoscale PMOS Devices

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Institute of Electrical and Electronics Engineers (IEEE), 2008

Published in: IEEE Transactions on Nanotechnology

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