Enthält:
High-resolution electron microscopy of crystals / W. Neumann, M. Pasemann, and J. Heydenreich
In-situ UHV electron microscopy of surfaces / K. Yagi, K. Yagi, K. Takayanagi, and G. Honjo
EXAFS studies of crystalline materials / G.S. Knapp and P. Georgopoulos
Single crystals of refractory and rare metals, alloys, and compounds / E.M. Savitsky, G.S. Burkhanov, and V.M. Kirillova.