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Levinštejn, Michail E. [Editor]; Shur, Michael S. [Other]

Semiconductor technology : processing and novel fabrication techniques

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New York, NY; Weinheim [u.a.]: Wiley, c1997

Published in: A Wiley-Interscience publication
Holt, D. B. [Author]; Yacobi, B. G. [Author]

Extended defects in semiconductors : electronic properties, device effects and structures

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Cambridge [u.a.]: Cambridge Univ. Press, c 2007
International Symposium on Defect Recognition and Image Processing in III-V Compounds 2 1987 Monterey, Calif

Defect recognition and image processing in III-V compounds / 2, (DRIP II), Monterey, California, April 27 - 29, 1987

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Amsterdam: Elsevier, 1987

Published in: Defect recognition and image processing in III-V compounds ; 2 - Materials science monographs ; 44
International Symposium on Defect Recognition and Image Processing in III-V Compounds

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recognition and Image Processing in III-V Compounds

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Amsterdam [u.a.]: Elsevier, 1985-1987

Published in: Materials science monographs ; .
Aleksandrov, Leonid Naumovič [Author]; Zotov, Michail Ivanovič [Author]

Vnutrennee trenie i defekty v poluprovodnikach

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Novosibirsk: Izdatelʹstvo Nauka, 1979
Bir, Gennadij L. [Author] ; Pikus, Grigorij E. [Other]

Simmetrija i deformacionnye ėffekty v poluprovodnikach

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Moskva: Izd. Nauka, 1972
Amersekera, E. A. [Author]; Campbell, D. S. [Author]

Failure mechanisms in semiconductor devices

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Chichester [u.a.]: Wiley, 1987
McCluskey, Matthew D. [Author]; Haller, Eugene E. [Author]

Dopants and defects in semiconductors - [Second edition]

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Boca Raton; London; New York: CRC Press, Taylor & Francis Group, [2018]
McCluskey, Matthew D. [Author]; Haller, Eugene E. [Author]

Dopants and defects in semiconductors

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Boca Raton, Fla. [u.a.]: CRC Press/Taylor & Francis, 2012
Jarzȩbski, Zdzisław M. [Author] ; Pamplin, Brian Randell [Other]; Jarzebski, Zdzislaw M. [Other]

Oxide semiconductors

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Oxford; Braunschweig [u.a.]: Pergamon Press, 1973

Published in: International series of monographs in the science of the solid state ; 4
Agarwala, Rajendra P. [Editor]

Special defects in semiconducting materials

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Uetikon-Zuerich [u.a.]: Scitec Publ., 2000

Published in: Diffusion and defect data / B ; 71
Perevoščikov, Viktor A. [Author] ; Skupov, Vladimir D. [Other]; Perevostchikov, Viktor A. [Other]

Gettering defects in semiconductors

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Berlin; Heidelberg; New York: Springer, 2005

Published in: Advanced microelectronics ; 19
Voldman, Steven H. [Author]

Latchup in semiconductor technology

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Chichester [u.a.]: Wiley, 2007
Fistul', Viktor I. [Author]; Fistul, Viktor I. [Author]

Impurities in semiconductors : solubility, migration, and interactions

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Boca Raton, Fla. [u.a.]: CRC Press, 2004
Ueda, Osamu [Author]

Reliability and degradation of III-V optical devices

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Boston [u.a.]: Artech House, 1996

Published in: Artech House optoelectronics library
Pajot, Bernard [Other]; Clerjaud, Bernard [Other]

Optical absorption of impurities and defects in semiconducting crystals

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Berlin; Heidelberg: Springer, 20XX-

Published in: Springer series in solid-state sciences ; .
Krause-Rehberg, Reinhard [Author]; Leipner, Hartmut S. [Author]

Positron annihilation in semiconductors : defect studies; with 20 tables

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Berlin; Heidelberg; New York; Barcelona; Hong Kong; London; Milan; Paris; Singapore; Tokyo: Springer, 1999

Published in: Springer series in solid-state sciences ; 127
Chikawa, Junichi [Editor]; Sumino, K. [Other]; Wada, K. [Other] ; Japan Kagaku Gijutsuchō, Symposium on Defects and Qualities of Semiconductors 1984 Tokio

Defects and properties of semiconductors : defect engineering

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Tokyo [u.a.]: KTK Scientific Publ. [u.a.], 1987

Published in: Advances in solid state technology ; 3
Ker, Ming-Dou [Author]; Hsu, Sheng-Fu [Author]

Transient-induced latchup in CMOS integrated circuits

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Singapore [u.a.]: Wiley [u.a.], 2009
Spaeth, Johann-Martin [Author]; Overhof, Harald [Author]

Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions

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Berlin; Heidelberg [u.a.]: Springer, 2003

Published in: Springer series in materials science ; 51

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