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  1. Hinken, David [Author]; Schinke, Carsten [Author]; Herlufsen, Sandra [Author]; Schmidt, Arne [Author]; Bothe, Karsten [Author]; Brendel, Rolf [Author]

    Experimental setup for camera-based measurements of electrically and optically stimulated luminescence of silicon solar cells and wafers - [published Version]

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    College Park, MD : American Institute of Physics, 2011

    Published in: Review of Scientific Instruments 82 (2011), Nr. 3

  2. Berski, Fabian [Author]; Kuhn, Hendrik [Author]; Lonnemann, Jan G. [Author]; Hübner, Jens [Author]; Oestreich, Michael [Author]

    Ultrahigh bandwidth spin noise spectroscopy: Detection of large g-factor fluctuations in highly-n-doped GaAs - [published Version]

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    College Park, MD : American Physical Society, 2013

    Published in: Physical Review Letters 111 (2013), Nr. 18

  3. Barranco, German Fernandez [Author]; Sheard, Benjamin S. [Author]; Dahl, Christian [Author]; Mathis, Wolfgang [Author]; Heinzel, Gerhard [Author]

    A low-power, low-noise 37-MHz photoreceiver for intersatellite laser interferometers using discrete heterojunction bipolar transistors - [published Version]

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    Piscataway, NJ : Institute of Electrical and Electronics Engineers Inc., 2018

    Published in: IEEE Sensors Journal (2018)

  4. Cao, Xin [Author]; Yang, Jingzhong [Author]; Li, Pengji [Author]; Zhang, Yiteng [Author]; Rugeramigabo, Eddy P. [Author]; Brechtken, Benedikt [Author]; Haug, Rolf J. [Author]; Zopf, Michael [Author]; Ding, Fei [Author]

    Single photon emission from ODT passivated near-surface GaAs quantum dots - [published Version]

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    Melville, NY : American Inst. of Physics, 2021

    Published in: Applied Physics Letters 118 (2021), Nr. 22 ; Applied Physics Letters

  5. Koch, P. [Author]; Cole, G.D. [Author]; Deutsch, C. [Author]; Follman, D. [Author]; Heu, P. [Author]; Kinley-Hanlon, M. [Author]; Kirchhoff, R. [Author]; Leavey, S. [Author]; Lehmann, J. [Author]; Oppermann, P. [Author]; Rai, A.K. [Author]; Tornasi, Z. [Author]; Wöhler, J. [Author]; Wu, D.S. [Author]; Zederbauer, T. [Author]; Lück, H. [Author]

    Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry - [published Version]

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    Washington, DC : OSA - The Optical Society, 2019

    Published in: Optics Express 27 (2019), Nr. 25