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  1. Bauer, Ulrich [Author]; Landi, Claudia [Author]; Mémoli, Facundo [Author] ; Ulrich Bauer and Claudia Landi and Facundo Mémoli [Contributor]

    The Reeb Graph Edit Distance Is Universal

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    Schloss Dagstuhl – Leibniz-Zentrum für Informatik, 2020

  2. Charalampopoulos, Panagiotis [Author]; Gawrychowski, Paweł [Author]; Mozes, Shay [Author]; Weimann, Oren [Author] ; Panagiotis Charalampopoulos and Paweł Gawrychowski and Shay Mozes and Oren Weimann [Contributor]

    An Almost Optimal Edit Distance Oracle

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    Schloss Dagstuhl – Leibniz-Zentrum für Informatik, 2021

  3. Hoppen, Carlos [Author]; Kohayakawa, Yoshiharu [Author]; Lang, Richard [Author]; Lefmann, Hanno [Author]; Stagni, Henrique [Author] ; Carlos Hoppen and Yoshiharu Kohayakawa and Richard Lang and Hanno Lefmann and Henrique Stagni [Contributor]

    Estimating Parameters Associated with Monotone Properties

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    Schloss Dagstuhl – Leibniz-Zentrum für Informatik, 2016

  4. Bui, Quang Anh [Author] ; La Rochelle [Contributor]; Mullot, Rémy [Contributor]; Visani, Muriel [Contributor]

    Vers un système omni-langage de recherche de mots dans des bases de documents écrits homogènes ; Towards an omni-language word retrieval system applied in homogeneous document collections

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    theses.fr, 2015-09-28

  5. Madi, Kamel [Author] ; Lyon [Contributor]; Kheddouci, Hamamache [Contributor]; Seba Lagraa, Hamida [Contributor]; Bichot, Charles-Edmond [Contributor]

    Inexact graph matching : application to 2D and 3D Pattern Recognition ; Appariement inexact de graphes : application à la reconnaissance de formes 2D et 3D

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    theses.fr, 2016-12-13

  6. Darwiche, Mostafa [Author] ; Tours [Contributor]; Conte, Donatello [Contributor]; T'kindt, Vincent [Contributor]

    When operations research meets structural pattern recognition : on the solution of error-tolerant graph matching problems ; Lorsque la recherche opérationnelle croise la reconnaissance d'objets structurels : la résolution des problèmes d'appariement de graphes tolérants à l'erreur

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    theses.fr, 2018-12-05

  7. Myers, R.; Wison, R.C.; Hancock, E.R.

    Bayesian graph edit distance

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    Institute of Electrical and Electronics Engineers (IEEE), 2000

    Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence

  8. Dzido, Tomasz; Krzywdziński, Krzysztof

    Edit distance measure for graphs

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    Institute of Mathematics, Czech Academy of Sciences, 2015

    Published in: Czechoslovak Mathematical Journal