Skip to contents

Mulaosmanovic, Halid; Breyer, Evelyn T; Dünkel, Stefan; Beyer, Sven; Mikolajick, Thomas; Slesazeck, Stefan

Ferroelectric field-effect transistors based on HfO2: a review

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

IOP Publishing, 2021

Published in: Nanotechnology
Mulaosmanovic, Halid; Kleimaier, Dominik; Dünkel, Stefan; Beyer, Sven; Mikolajick, Thomas; Slesazeck, Stefan

Ferroelectric transistors with asymmetric double gate for memory window exceeding 12 V and disturb-free read

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Royal Society of Chemistry (RSC), 2021

Published in: Nanoscale
Mulaosmanovic, Halid; Dünkel, Stefan; Trentzsch, Martin; Beyer, Sven; Breyer, Evelyn T.; Mikolajick, Thomas; Slesazeck, Stefan

Frequency Mixing with HfO2-Based Ferroelectric Transistors

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

American Chemical Society (ACS), 2020

Published in: ACS Applied Materials & Interfaces
Mulaosmanovic, Halid; Dunkel, Stefan; Trentzsch, Martin; Beyer, Sven; Breyer, Evelyn T.; Mikolajick, Thomas; Slesazeck, Stefan

Investigation of Accumulative Switching in Ferroelectric FETs: Enabling Universal Modeling of the Switching Behavior

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2020

Published in: IEEE Transactions on Electron Devices
Schroeder, Uwe; Mueller, Johannes; Yurchuk, Ekatarina; Mueller, Stefan; Martin, Dominik; Slesazeck, Stefan; Mikolajick, Thomas

Hafnium Oxide Based CMOS Compatible Ferroelectric Materials

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

The Electrochemical Society, 2012

Published in: ECS Meeting Abstracts
Dahan, Mor M.; Breyer, Evelyn T.; Slesazeck, Stefan; Mikolajick, Thomas; Kvatinsky, Shahar

C-AND: Mixed Writing Scheme for Disturb Reduction in 1T Ferroelectric FET Memory

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2022

Published in: IEEE Transactions on Circuits and Systems I: Regular Papers
Marchand, Cedric; O'Connor, Ian; Cantan, Mayeul; Breyer, Evelyn T.; Slesazeck, Stefan; Mikolajick, Thomas

A FeFET-Based Hybrid Memory Accessible by Content and by Address

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2022

Published in: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Ascoli, Alon; Weiher, Martin; Herzig, Melanie; Slesazeck, Stefan; Mikolajick, Thomas; Tetzlaff, Ronald

Graph Coloring via Locally-Active Memristor Oscillatory Networks

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

MDPI AG, 2022

Published in: Journal of Low Power Electronics and Applications
Hoffmann, Michael; Gui, Mengcheng; Slesazeck, Stefan; Fontanini, Riccardo; Segatto, Mattia; Esseni, David; Mikolajick, Thomas

Intrinsic Nature of Negative Capacitance in Multidomain Hf0.5Zr0.5O2‐Based Ferroelectric/Dielectric Heterostructures

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Wiley, 2022

Published in: Advanced Functional Materials
Lancaster, Suzanne; Lomenzo, Patrick D.; Engl, Moritz; Xu, Bohan; Mikolajick, Thomas; Schroeder, Uwe; Slesazeck, Stefan

Investigating charge trapping in ferroelectric thin films through transient measurements

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Frontiers Media SA, 2022

Published in: Frontiers in Nanotechnology
Weiher, Martin; Herzig, Melanie; Tetzlaff, Ronald; Ascoli, Alon; Mikolajick, Thomas; Slesazeck, Stefan

Improved Vertex Coloring With NbOₓ Memristor-Based Oscillatory Networks

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2021

Published in: IEEE Transactions on Circuits and Systems I: Regular Papers
Ascoli, Alon; Demirkol, Ahmet S.; Tetzlaff, Ronald; Slesazeck, Stefan; Mikolajick, Thomas; Chua, Leon O.

On Local Activity and Edge of Chaos in a NaMLab Memristor

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Frontiers Media SA, 2021

Published in: Frontiers in Neuroscience
Trommer, Jens; Simon, Maik; Slesazeck, Stefan; Weber, Walter M.; Mikolajick, Thomas

Inherent Charge-Sharing-Free Dynamic Logic Gates Employing Transistors With Multiple Independent Inputs

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2020

Published in: IEEE Journal of the Electron Devices Society
Herzig, Melanie; Weiher, Martin; Ascoli, Alon; Tetzlaff, Ronald; Mikolajick, Thomas; Slesazeck, Stefan

Improvement of NbOx-based threshold switching devices by implementing multilayer stacks

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

IOP Publishing, 2019

Published in: Semiconductor Science and Technology
Herzig, Melanie; Weiher, Martin; Ascoli, Alon; Tetzlaff, Ronald; Mikolajick, Thomas; Slesazeck, Stefan

Multiple slopes in the negative differential resistance region of NbOx-based threshold switches

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

IOP Publishing, 2019

Published in: Journal of Physics D: Applied Physics
Hoffmann, Michael; Fengler, Franz Paul Gustav; Max, Benjamin; Schroeder, Uwe; Slesazeck, Stefan; Mikolajick, Thomas

Negative Capacitance for Electrostatic Supercapacitors

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Wiley, 2019

Published in: Advanced Energy Materials
Weiher, Martin; Herzig, Melanie; Tetzlaff, Ronald; Ascoli, Alon; Mikolajick, Thomas; Slesazeck, Stefan

Pattern Formation With Locally Active S-Type NbOx Memristors

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2019

Published in: IEEE Transactions on Circuits and Systems I: Regular Papers
Knebel, Steve; Zhou, Dayu; Schroeder, Uwe; Slesazeck, Stefan; Pesic, Milan; Agaiby, Rimoon; Heitmann, Johannes; Mikolajick, Thomas

Reliability Comparison of ZrO2-Based DRAM High-k Dielectrics Under DC and AC Stress

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2017

Published in: IEEE Transactions on Device and Materials Reliability
Wylezich, Helge; Mähne, Hannes; Heinrich, Anett; Slesazeck, Stefan; Rensberg, Jura; Ronning, Carsten; Zahn, Peter; Mikolajick, Thomas

Adjusting the forming step for resistive switching in Nb2O5 by ion irradiation

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

American Vacuum Society, 2015

Published in: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Kupke, Steve; Knebel, Steve; Ocker, Johannes; Slesazeck, Stefan; Agaiby, Rimoon; Trentzsch, Martin; Mikolajick, Thomas

Experimental Proof of the Drain-Side Dielectric Breakdown of HKMG nMOSFETs Under Logic Circuit Operation

View online
Schließen

Access

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Institute of Electrical and Electronics Engineers (IEEE), 2015

Published in: IEEE Electron Device Letters

You did not find what you were looking for?

Purchase suggestion
Are you missing something you need for your research? If you have any suggestions please share them here.

Interlibrary Loan
Please search and order your favorite title in the Interlibrary Loan Portal.

Search in field:

Recently searched for:

You did not find what you were looking for?

> Year of publication

Year of publication