Media type: E-Article Title: Reliability Comparison of ZrO2-Based DRAM High-k Dielectrics Under DC and AC Stress Contributor: Knebel, Steve; Zhou, Dayu; Schroeder, Uwe; Slesazeck, Stefan; Pesic, Milan; Agaiby, Rimoon; Heitmann, Johannes; Mikolajick, Thomas imprint: Institute of Electrical and Electronics Engineers (IEEE), 2017 Published in: IEEE Transactions on Device and Materials Reliability Language: Not determined DOI: 10.1109/tdmr.2017.2699287 ISSN: 1558-2574; 1530-4388 Keywords: Electrical and Electronic Engineering ; Safety, Risk, Reliability and Quality ; Electronic, Optical and Magnetic Materials Origination: Footnote: