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Ratzke, Markus [Author] ; Reif, Jürgen [Degree supervisor]

Kraftmikroskopie als Werkzeug zur Charakterisierung elektrischer Oberflächeneigenschaften

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Cottbus: Universitätsbibliothek der BTU Cottbus, 2012
Jambreck, Joachim Dietmar [Author] ; Frey, Lothar [Degree supervisor]

Entwicklung und Herstellung von neuartigen Sonden für die elektrische und optische Rastersondenmikroskopie

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Erlangen: Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), 2015
Wang, Lin [Author]

Carrier profiling of ZnO nanowire structures by scanning capacitance microscopy and scanning spreading resistance microscopy ; Profilage porteur de structures de nanofils ZnO par microscopie à capacité de balayage et microscopie à dispersion

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[Erscheinungsort nicht ermittelbar]: HAL CCSD, 2016
Bugg, C D; King, P J

Scanning capacitance microscopy

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IOP Publishing, 1988

Published in: Journal of Physics E: Scientific Instruments
Matey, J R.

Scanning Capacitance Microscopy

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SPIE, 1988

Published in: SPIE Proceedings
Matey, J. R.; Blanc, J.

Scanning capacitance microscopy

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AIP Publishing, 1985

Published in: Journal of Applied Physics
Ruda, H. E.; Shik, A.

Scanning capacitance microscopy of nanostructures

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American Physical Society (APS), 2005

Published in: Physical Review B
Balagurov, D. B.; Klyuchnik, A. V.; Lozovik, Yu. E.

Theory of scanning capacitance microscopy

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Pleiades Publishing Ltd, 2000

Published in: Physics of the Solid State
Humer, I.; Bethge, O.; Bodnarchuk, M.; Kovalenko, M.; Yarema, M.; Heiss, W.; Huber, H. P.; Hochleitner, M.; Hinterdorfer, P.; Kienberger, F.; Smoliner, J.

Scanning microwave microscopy and scanning capacitance microscopy on colloidal nanocrystals

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AIP Publishing, 2011

Published in: Journal of Applied Physics
Pahlmeyer, M.; Hankins, A.; Tuppan, S.; Kim, W. J.

Scanning capacitance microscopy using a relaxation oscillator

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American Association of Physics Teachers (AAPT), 2015

Published in: American Journal of Physics
Murray, Hugues; Germanicus, Rosine; Doukkali, Aziz; Martin, Patrick; Domenges, Bernadette; Descamps, Philippe

Analytic description of scanning capacitance microscopy

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American Vacuum Society, 2007

Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Lee, D T; Pelz, J P; Bhushan, Bharat

Scanning capacitance microscopy for thin film measurements

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IOP Publishing, 2006

Published in: Nanotechnology
Tarun, A.B.; Laniog, J.N.; Tan, J.M.; Cana, P.N.

Junction Leakage Analysis Using Scanning Capacitance Microscopy

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Institute of Electrical and Electronics Engineers (IEEE), 2004

Published in: IEEE Transactions on Device and Materials Reliability
Shik, A.

A Theoretical Analysis of Scanning Capacitance Microscopy

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AIP, 2003

Published in: AIP Conference Proceedings
Ruda, H. E.; Shik, A.

Theoretical analysis of scanning capacitance microscopy

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American Physical Society (APS), 2003

Published in: Physical Review B
Raineri, Vito; Giannazzo, Filippo

Scanning Capacitance Microscopy on Semiconductor Materials

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Trans Tech Publications, Ltd., 2001

Published in: Solid State Phenomena
Zavyalov, V. V.; McMurray, J. S.; Williams, C. C.

Noise in scanning capacitance microscopy measurements

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American Vacuum Society, 2000

Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Stephenson, Robert; Verhulst, Anne; De Wolf, Peter; Caymax, Matty; Vandervorst, Wilfried

Contrast reversal in scanning capacitance microscopy imaging

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AIP Publishing, 1998

Published in: Applied Physics Letters
Goto, Kazuya; Hane, Kazuhiro

Tapping mode scanning capacitance microscopy: feasibility of quantitative capacitance measurement

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SPIE, 1997

Published in: SPIE Proceedings
Fukuzawa, Ryota; Takahashi, Takuji

Peak-tracking scanning capacitance force microscopy with multibias modulation technique

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IOP Publishing, 2022

Published in: Measurement Science and Technology

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