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  1. Wang, Lin [Author]

    Carrier profiling of ZnO nanowire structures by scanning capacitance microscopy and scanning spreading resistance microscopy ; Profilage porteur de structures de nanofils ZnO par microscopie à capacité de balayage et microscopie à dispersion

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    [Erscheinungsort nicht ermittelbar]: HAL CCSD, 2016

  2. Murray, Hugues; Germanicus, Rosine; Doukkali, Aziz; Martin, Patrick; Domenges, Bernadette; Descamps, Philippe

    Analytic description of scanning capacitance microscopy

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    American Vacuum Society, 2007

    Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 25 (2007) 4, Seite 1340-1352

  3. Zavyalov, V. V.; McMurray, J. S.; Williams, C. C.

    Noise in scanning capacitance microscopy measurements

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    American Vacuum Society, 2000

    Published in: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 18 (2000) 3, Seite 1125-1133