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DKE Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE, German Commission for Electrical, Electronic and Information Technologies of DIN and VDE, DIN Deutsches Institut für Normung e. V., DIN German Institute for Standardization

DIN EN 61243-2/A2*VDE 0682-412/A1 : Arbeiten unter Spannung - Spannungsprüfer - Teil 2: Resistive (ohmsche) Ausführungen für Wechselspannungen von 1 kV bis 36 kV (IEC 61243-2:1995/A2:2002); Änderung A2; Deutsche Fassung EN 61243-2:1997/A2:2002 - [2003-09-00]

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Berlin, Wien, Zürich: Beuth Verlag, 2003

Published in: DIN-Regelwerk- Deutsche Normen
DKE Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE, German Commission for Electrical, Electronic and Information Technologies of DIN and VDE, DIN Deutsches Institut für Normung e. V., DIN German Institute for Standardization

DIN EN 61243-2*VDE 0682-412 : Arbeiten unter Spannung - Spannungsprüfer - Teil 2: Resistive (ohmsche) Ausführungen für Wechselspannungen von 1 kV bis 36 kV (Einschließlich Änderung A1:2000) (IEC 61243-2:1995 + A1:1999 + Corrigendum 2000); Deutsche Fassung EN 61243-2:1997 + A1:2000 - [2001-12-00]

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Berlin, Wien, Zürich: Beuth Verlag, 2001

Published in: DIN-Regelwerk- Deutsche Normen
Lange, Stefan [Author] ; Scheer, Roland [Other]; Wehrspohn, Ralf B. [Other]; Schmidt, Jan [Other]

Parasitäre Oxide an vergrabenen Grenzflächen in modernen Silizium-Solarzellen

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Halle (Saale): Universitäts- und Landesbibliothek Sachsen-Anhalt, 2023
Andrade, Jaime M. M. [Author]; Rosário, Carlos M. M. [Author]; Menzel, Stephan [Author]; Waser, Rainer [Author]; Sobolev, Nikolai A. [Author]

Application of the Quantum-Point-Contact Formalism to Model the Filamentary Conduction in Ta 2 O 5 -Based Resistive Switching Devices

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American Physical Society, 2022

Published in: Physical review applied 17(3), 034062 (2022). doi:10.1103/PhysRevApplied.17.034062
Einsele, F. [Author]; Rostan, P. J. [Author]; Schubert, M. B. [Author]; Rau, U. [Author]

Recombination and Resistive Losses at ZnO/a-Si:H/c-Si Interfaces in Heterojunction Back Contacts for Silicon Solar Cells

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American Institute of Physics, 2007

Published in: Journal of applied physics 102, 094507 (2007). doi:10.1063/1.2803749
Uvarov, Ilya V.; Naumov, Victor V.; Selyukov, Roman V.

Electrostatically actuated MEMS switch with resistive contact

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SPIE, 2014

Published in: SPIE Proceedings (2014)
Mey, G.

Contact versus bulk noise in resistive layers

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Springer Science and Business Media LLC, 1985

Published in: Applied Physics A Solids and Surfaces, 36 (1985) 4, Seite 183-187
Goldsmid, H J; Milner, C J

Short resistive contacts to Hall specimens

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IOP Publishing, 1976

Published in: Journal of Physics D: Applied Physics, 9 (1976) 15, Seite L183-L185
Uvarov, I V; Naumov, V V; Kupriyanov, A N; Koroleva, O M; Vaganova, E I; Amirov, I I

Resistive contact MEMS switch in a “hot” operation mode

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IOP Publishing, 2017

Published in: Journal of Physics: Conference Series, 917 (2017), Seite 082001
Ghenzi, N.; Stoliar, P.; Fuertes, M.C.; Marlasca, F.G.; Levy, P.

Resistive switching in Ag–TiO2 contacts

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Elsevier BV, 2012

Published in: Physica B: Condensed Matter, 407 (2012) 16, Seite 3096-3098
Martinelli, L; Hurschler, C; Rosenbaum, D

Comparison of Capacitive versus Resistive Joint Contact Stress Sensors

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Ovid Technologies (Wolters Kluwer Health), 2006

Published in: Clinical Orthopaedics & Related Research, 447 (2006), Seite 214-220
Rashba, E.I.

Diffusion theory of spin injection through resistive contacts

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Springer Science and Business Media LLC, 2002

Published in: The European Physical Journal B - Condensed Matter, 29 (2002) 4, Seite 513-527
Onomi, T.; Mizugaki, Y.; Nakajima, K.; Yamashita, T.

Extended phase-mode logic-circuits with resistive ground contact

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Institute of Electrical and Electronics Engineers (IEEE), 1995

Published in: IEEE Transactions on Appiled Superconductivity, 5 (1995) 3, Seite 3464-3471
James, T.E.; James, D.C.

Resistive contact region solid armatures: electro-thermal design optimisation

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Institute of Electrical and Electronics Engineers (IEEE), 1995

Published in: IEEE Transactions on Magnetics, 31 (1995) 1, Seite 162-167
Woelk, E.G.; Krautle, H.; Beneking, H.

Measurement of low resistive ohmic contacts on semiconductors

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Institute of Electrical and Electronics Engineers (IEEE), 1986

Published in: IEEE Transactions on Electron Devices, 33 (1986) 1, Seite 19-22
Schiavone, L. M.; Pritchard, A. A.

Ohmic contacts for moderately resistive p−type InP

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AIP Publishing, 1975

Published in: Journal of Applied Physics, 46 (1975) 1, Seite 452-453
Adde, R.; Vernet, G.

Harmonic Generation by Resistive Feedback from Superconducting Point Contacts

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AIP Publishing, 1972

Published in: Journal of Applied Physics, 43 (1972) 5, Seite 2405-2406
Mylo Valappil, Sreenath; Zkria, Abdelrahman; Ohmagari, Shinya; Naragino, Hiroshi; Kato, Hiromitsu; Yoshitake, Tsuyoshi

Corrosion‐Resistive and Low Specific Contact Resistance Ohmic Contacts to Semiconducting Diamonds Using Nanocarbon Electrodes

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Wiley, 2023

Published in: physica status solidi (a), 220 (2023) 3
Comby-Dassonneville, Solène; Volpi, Fabien; Parry, Guillaume; Pellerin, Didier; Verdier, Marc

Resistive-nanoindentation: contact area monitoring by real-time electrical contact resistance measurement

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Springer Science and Business Media LLC, 2019

Published in: MRS Communications, 9 (2019) 3, Seite 1008-1014
Dvoranová, Mária; Plecenik, Tomáš; Moško, Martin; Vidiš, Marek; Gregor, Maroš; Roch, Tomáš; Grančič, Branislav; Satrapinskyy, Leonid; Kúš, Peter; Plecenik, Andrej

Point contact spectroscopy of superconductors via nanometer scale point contacts formed by resistive switching

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AIP Publishing, 2018

Published in: AIP Advances, 8 (2018) 12

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