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  1. Zevin, Lev S. [Author] ; Kimmel, Giora [Other]; Mureinik, Inez [Other]

    Quantitative x-ray diffractometry

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    New York; Berlin; Heidelberg [u.a.]: Springer, 1995

  2. Chejker, Daniėl' M. [Author]; Zevin, Lev S. [Author]

    Rentgenovskaja difraktometrija

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    Moskva: Gos. Izd. Fiz.-Mat. Lit., 1963

    Published in: Fiziko-matematičeskaja biblioteka inženera

  3. Fultz, Brent [Author]; Howe, James M. [Author]

    Transmission electron microscopy and diffractometry of materials

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    Berlin; Heidelberg; New York; Barcelona; Hong Kong; London; Milan; Paris; Singapore; Tokyo: Springer, 2001

    Published in: Physics and astronomy online library