Media type: Book Title: High resolution X-ray diffractometry and topography Contributor: Bowen, David Keith [Author]; Tanner, Brian K. [Author] imprint: London [u.a.]: Taylor & Francis, 1998 Extent: X, 252 S; Ill., graph. Darst Language: English ISBN: 0850667585 RVK notation: UQ 5100 : Lehrbücher der Kristallstrukturbestimmung und Röntgenographie Keywords: Röntgendiffraktometrie > Röntgentopographie > Hochauflösendes Verfahren Röntgendiffraktometrie Origination: Footnote: Literaturangaben
Departmental Library DrePunct – open access area Shelf-mark: UQ 5100 B786 Item ID: 30899219 Status: Loanable