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  1. Wenisch, R. [Author]; Lungwitz, F. [Author]; Hanf, D. [Author]; Heller, R. [Author]; Zscharschuch, J. [Author]; Hübner, R. [Author]; von Borany, J. [Author]; Abrasonis, G. [Author]; Gemming, S. [Author]; Escobar-Galindo, R. [Author]; Krause, M. [Author]

    Cluster tool for in situ processing and comprehensive characterization of thin films at high temperatures

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    [2019]

    Published in: Analytical Chemistry ; 90 (2018), Seite 7837-7842

  5. Negara, Christian Emanuel [Author] ; Beyerer, J. [Degree supervisor]; Lemmer, Uli [Degree supervisor]

    Abbildende Ellipsometrie mit Lichtwegumkehrung für die optische Charakterisierung von gekrümmten Oberflächen

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    Karlsruhe: KIT Scientific Publishing, 2023

    Published in: Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung ; 21

  6. Sill, Annekatrin [Author] ; Helm, Christiane A. [Degree supervisor]; Sukhishvili, Sventlana [Other]; Schönhoff, Monika [Other]

    Vertical diffusion of polyelectrolytes in polyelectrolyte multilayers during film preparation and post preparation treatment

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    Greifswald: Universität Greifswald, 2022

  7. Butt, Muhammad Abdullah Tariq [Author] ; Leuchs, Gerd [Degree supervisor]; Joly, Nicolas [Other]

    On the interaction of light with novel artificial materials – Intriguing phenomena and an extended toolbox

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    Erlangen: Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), 2021

    Published in: Erlanger Forschungen / B, Naturwissenschaften und Medizin ; 1

  10. Erber, Michael [Author] ; Voit, Brigitte [Degree supervisor]; Jordan, Rainer [Degree supervisor]

    ˜Dieœ glasartige Dynamik von Polymeren mit spezieller Architektur in eingeschränkter Geometrie dünner Filme

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    Dresden: Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden; Dresden: Technische Universität Dresden, 2010

  12. Lehmann, Daniel [Author]; Seidel, Falko [Author]; Zahn, Dietrich R.T. [Author] ; Technische Universität Chemnitz

    Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry

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    Heidelberg: Springer-Verlag GmbH, [2014]

  13. Lee, J.H. [Author]; Ke, X. [Author]; Podraza, N.J. [Author]; Kourkoutis, L.F. [Author]; Heeg, T. [Author]; Fennie, C.J. [Author]; Schubert, J. [Author]; Muller, D.A. [Author]; Schiffer, P. [Author]; Schlom, D.G. [Author]

    Optical band gap and magnetic properties of unstrained EuTiO3 films

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    American Institute of Physics, 2009

    Published in: Applied physics letters 94, 212509 (2009). doi:10.1063/1.3133351

  15. Röling, Christian [Author] ; Vana, Philipp [Degree supervisor]; Janshoff, Andreas [Other]; Zeuch, Thomas [Other]; Enderlein, Jörg [Other]; Ehlers, Florian [Other]; Schroeder, Jörg [Other]

    Anwendungsbezogene Weiterentwicklung der abbildenden Ellipsometrie

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    Göttingen: Niedersächsische Staats- und Universitätsbibliothek Göttingen, 2017

  16. Adam, Stefan [Author] ; Stamm, Manfred [Degree supervisor]; Stamm, Manfred [Other]; Seibt, Klaus [Other]

    Entwicklung von neuartigen thermoresponsiven Oberflächenbeschichtungen auf der Basis von Poly-2-oxazolinen

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    Dresden: Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden; Dresden: Technische Universität Dresden, 2016

  17. Nißler, Ulrich [Author] ; Haas, Werner [Degree supervisor]

    Dichtheit von Hydraulikstangendichtringen aus Polyurethan : Einfluss von Geometrieveränderungen an PU-Nutringen auf deren Dichtverhalten und Vergleich verschiedener Dichtheitsbewertungen

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    Stuttgart: Universitätsbibliothek der Universität Stuttgart, 2015

    Published in: Berichte aus dem Institut für Maschinenelemente ; 161

  18. Sheremet, E. [Author]; Milekhin, A. G. [Author]; Rodriguez, R. D. [Author]; Weiss, T. [Author]; Nesterov, M. [Author]; Rodyakina, E. E. [Author]; Gordan, O. D. [Author]; Sveshnikova, L. L. [Author]; Duda, T. A. [Author]; Gridchin, V. A. [Author]; Dzhagan, V. M. [Author]; Hietschold, M. [Author]; Zahn, D. R. T. [Author]

    Surface- and tip-enhanced resonant Raman scattering from CdSe nanocrystals

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    Cambridge: Royal Society of Chemistry, [2015]

  19. Reiter, Sina [Author]; Koper, Nico [Author]; Reineke-Koch, Rolf [Author]; Larionova, Yevgeniya [Author]; Turcu, Mircea [Author]; Krügener, Jan [Author]; Tetzlaff, Dominic [Author]; Wietler, Tobias [Author]; Höhne, Uwe [Author]; Kähler, Jan-Dirk [Author]; Brendel, Rolf [Author]; Peibst, Robby [Author]

    Parasitic Absorption in Polycrystalline Si-layers for Carrier-selective Front Junctions

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    London : Elsevier Ltd., 2016

    Published in: Energy Procedia 92 (2016)