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Heyman, Joseph S. [Editor] ; Electronics Reliability and Measurement Technology Workshop 1986 Hampton, Va

Electronics reliability and measurement technology : nondestructive evaluation

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Park Ridge, NJ: Noyes Data Corporation, 1988
Ayala, José L. [Editor]; García-Cámara, Braulio [Other]; Prieto, Manuel [Other]; Ruggiero, Martino [Other]; Sicard, Gilles [Other] ; PATMOS 21 2011 Madrid

Integrated circuit and system design : power and timing modeling, optimization, and simulation ; 21st international workshop, PATMOS 2011, Madrid, Spain, September 26 - 29, 2011 ; proceedings

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Berlin; Heidelberg [u.a.]: Springer, 2011

Published in: Lecture notes in computer science ; 6951
Svensson, Lars [Editor]; Monteiro, José [Other] ; PATMOS 18 2008 Lissabon

Integrated circuit and system design : power and timing modeling, optimization and simulation : 18th international workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008 ; revised selected papers

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Berlin; Heidelberg [u.a.]: Springer, 2009

Published in: Lecture notes in computer science ; 5349
ETC 2 1991 München

Proceedings / ETC 91

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Berlin [u.a.]: Vde-Verl., 1991
Gerling, Wolfgang H. [Editor] ; ESREF 3 1992 Schwäbisch Gmünd, Informationstechnische Gesellschaft, Gesellschaft Mikroelektronik, Informationstechnische Gesellschaft

Conference proceedings / ESREF 92

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Berlin; Offenbach: VDE-Verl., 1992
Jones, W. Kinzy [Editor]; Harsányi, Gábor [Other] ; NATO Division of Scientific Affairs, Advanced Research Workshop on Multichip Modules with Integrated Sensors 1995 Budapest, Advanced Research Workshop on Multichip Modules with Integrated Sensors 1995 Budapest

Multichip modules with integrated sensors : [proceedings of the NATO Advanced Research Workshop on Multichip Modules with Integrated Sensors, Budapest, Hungary, May 18 - 20, 1995]

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Dordrecht [u.a.]: Kluwer Acad. Publ., 1996

Published in: NATO: NATO ASI series / Partnership sub-series / 3 ; 16
Ur, Shmuel [Other] ; International Haifa Verification Conference 1 2005 Haifa

Hardware and software verification and testing : first International Haifa Verification Conference, Haifa, Israel, November 13 - 16, 2005 ; revised selected papers

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Berlin; Heidelberg [u.a.]: Springer, 2006

Published in: Lecture notes in computer science ; 3875
Bin, Eyal [Editor]; Ziv, Avi [Other]; Ur, Shmuel [Other] ; International Haifa Verification Conference 2 2006 Haifa

Hardware and software, verification and testing : Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006 ; revised selected papers

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Berlin; Heidelberg [u.a.]: Springer, 2007

Published in: Lecture notes in computer science ; 4383
IEEE European Test Symposium (10th :2005 :Tallinn, Estonia), IEEE Computer Society Technical Council on Test Technology

European Test Symposium : ETS 2005 : proceedings : 22-25 May, 2005, [Reval Hotel Olümpia] Tallin, Estonia

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Los Alamitos, Calif: IEEE Computer Society Press, 2005
IEEE European Test Workshop (2003 :Maastricht, Netherlands), IEEE Computer Society Technical Council on Test Technology, IEEE Xplore (Online service)

Eighth IEEE European Test Workshop : proceedings : 25-28 May 2003, Maastricht, the Netherlands

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Los Alamitos, Calif: IEEE Computer Society, 2003
IEEE European Test Workshop (2003 :Masstricht, Netherlands), IEEE Computer Society Technical Council on Test Technology

Proceedings : eight IEEE European Test Workshop : 25-28 May, 2003, Maastricht, the Netherlands

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Los Alamitos, Calif: IEEE Computer Society Press, 2003
IEEE European Test Workshop (7th :2002 :Corfu, Greece), IEEE Computer Society Technical Council on Test Technology

ETW'02 : the Seventh IEEE European Test Workshop : proceedings : 26-29 May, 2002, Corfu, Greece

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Los Alamitos, Calif: IEEE Computer Society Press, 2002
IEEE European Test Workshop (2001 :Stockholm, Sweden), Ericsson Australia, IEEE Computer Society Test Technology Technical Committee, Linköpings högskola

IEEE European Test Workshop : proceedings : 29 May-1 June, 2001, Stockholm, Sweden

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Los Alamitos, Calif: IEEE Computer Society Press, 2001
IEEE European Test Workshop (2000 :Cascais, Portugal), IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society, Instituto de Engenharia de Sistemas e Computadores, Universidade Técnica de Lisboa Electrical and Computer Engineering Department

IEEE European Test Workshop : proceedings : 23-26 May, 2000, Cascais, Portugal

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Los Alamitos, Calif: IEEE Computer Society, 2000
Wunderlich, Hans-Joachim [Other] ; European Test Workshop 1999 (1999 :Constance, Germany)

European Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany

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Los Alamitos, CA: IEEE Computer Society, 1999
IEEE International Conference on Microelectronic Test Structures (1990 :San Diego, Calif.), IEEE Electron Devices Society

ICMTS 1990 : proceedings of the 1990 International Conference on Microelectronic Test Structures : March 5-7, 1990, San Diego, Calif

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New York, NY: Institute of Electrical and Electronics Engineers, 1990
Sekanina, Lukáš [Other] ; IEEE Computer Society, IEEE Computer Society Test Technology Technical Council

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 : 8 - 10 April 2013, Karlovy Vary, Czech Republic

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Piscataway, NJ: IEEE, 2013
Kotásek, Zdeněk [Other] ; Institute of Electrical and Electronics Engineers, IEEE Computer Society, IEEE Computer Society Test Technology Technical Council

IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2010 : 14 - 16 April 2010, Vienna, Austria

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Piscataway, NJ: IEEE, 2012
Raik, Jaan [Other] ; IEEE Computer Society, IEEE Computer Society Test Technology Technical Council

IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 : 18 - 20 April 2012, Tallin, Estonia

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Piscataway, NJ: IEEE, 2012
Vierhaus, Heinrich T. [Other] ; IEEE Computer Society, IEEE Computer Society Test Technology Technical Council

IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 : 13 - 15 April 2011, Cottbus, Germany

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Piscataway, NJ: IEEE, 2011

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