Media type: Book; Conference Proceedings Title: Electronics reliability and measurement technology : nondestructive evaluation Contributor: Heyman, Joseph S. [Editor] Event: Electronics Reliability and Measurement Technology Workshop Published: Park Ridge, NJ: Noyes Data Corporation, 1988 Extent: XII, 128 S; zahlr. Ill., graph. Darst Language: English ISBN: 081551171X RVK notation: ZN 4040 : Zuverlässigkeit elektronischer Bauelemente und Geräte Keywords: Zuverlässigkeit > Elektronik Elektronische Schaltung > Zuverlässigkeit Origination: Footnote: "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii Includes bibliographies and index
Departmental Library DrePunct – stack Shelf-mark: 0992 01614 001 Item ID: 32540979 Status: Loanable, place order > Ordering possible ‒ please log in Delivery expected: 1 - 2 days after order