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[New York]: IEEE, [c1977]
Benton, Janet L.
[Editor];
Maracas, George Nicolas
[Editor];
Rai-Choudhury, P.
[Editor]
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Symposium on Diagnostic Techniques for Semiconductor Materials and Devices 2 1991 Phoenix, Ariz,
Electrochemical Society Electronics Division,
Electrochemical Society Dielectric Science and Technology Division
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New York: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 2011 ;
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International Reliability Physics Symposium (16th :1978 :San Diego, Calif.),
IEEE Electron Devices Society,
IEEE Reliability Group
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New York: IEEE Electroni Devices Society, 1978
Menon, Sankaran M.
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Malaiya, Yashwant K.
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IEEE International Workshop on IDDQ Testing (4th :1998 :San Jose, Calif.),
IEEE Computer Society Technical Test Technology Committee
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Los Alamitos, Calif: IEEE Computer Society Press, 1998
Jayasumana, Anura P.
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IEEE International Workshop on IDDQ Testing (3rd :1997 :Washington, D.C.),
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Los Alamitos, Calif: IEEE Computer Society Press, 1997
Jayasumana, Anura P.
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Tong, Carol
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IEEE International Workshop on IDDQ Testing (1996 :Washington, D.C.),
IEEE Computer Society Test Technology Technical Committee
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Arlington, VA: JEDEC Solid State Technology Association, 1999
Rajsuman, Rochit
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IEEE International Workshop on Memory Technology, Design, and Testing (1994 :San Jose, Calif.),
IEEE Computer Society Test Technology Technical Committee,
IEEE Computer Society Technical Committee on VLSI
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Los Alamitos, Calif: IEEE Computer Society Press, 2011 ;
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Institute of Electrical and Electronics Engineers,
Institute of Electrical and Electronics Engineers Taipei Section,
Qinghua-Daxue Taipeh,
IEEE Computer Society Test Technology Technical Council
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Piscataway, NJ: IEEE, 2006
IEEE International Workshop on Memory Technology, Design, and Testing (13th :2005 :Taipei, Taiwan),
Guo li qing hua da xue (Hsinchu, Taiwan),
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Los Alamitos, Calif: IEEE Computer Society, 2005
Rajsuman, Rochit
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Wik, Thomas
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IEEE International Workshop on Memory Technology, Design, and Testing (12th :2004 :San Jose, Calif.),
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Los Alamitos, Calif: IEEE Computer Society, 2004
Singh, Adit
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Wit, Tom
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IEEE International Workshop on Memory Technology, Design, and Testing (11th :2003 :San Jose, Calif.),
IEEE Computer Society,
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Los Alamitos, Calif: IEEE Computer Society, 2003
Courtois, Bernard
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Zorian, Yervant
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IEEE International Workshop on Memory Technology, Design, and Testing (2002 :Isle of Bendor, France),
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[Piscataway, N.J.]: IEEE, 2002
Lombardi, Fabrizio
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Wik, Thomas
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IEEE International Workshop on Memory Technology, Design, and Testing (1997 :San Jose, Calif.),
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